SBIR Phase II: High Sensitivity Nanoprobe for Atomic and Molecular Imaging

小行星9506463 本研究的目的是开发一种高灵敏度的分析仪器，用于测定各种有机，无机和生物样品的化学成分。 该仪器将采用飞行时间二次离子质谱（TOF-SIMS）成像技术与飞秒激光后电离，以空间分辨率优于100纳米的二维和三维映射。 TOF-SIMS是表面质谱的一种变体，并且已经通过先前的研究被证明具有在预测灵敏度下成像的能力。 在这一研究阶段，分析仪的灵敏度及其成像能力将得到提高，其设计和操作将得到简化。 像这样的仪器有许多潜在的商业应用。 它将在包括表面现象分析、环境科学、临床分析、催化、半导体测试和药物筛选的领域中有用。

9506463 Bado The objective of this research is to develop a high-sensitivity analytical instrument for determining the chemical composition of various organic, inorganic, and biological samples. The instrument will employ the time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging technique with femtosecond laser post-ionization to map with spatial resolution better than 100 nanometers in two- and three-dimensions. TOF-SIMS is a variant of surface mass spectroscopy and has been proven through prior research to have the capability for imaging at the predicted sensitivity. In this research phase, the sensitivity of the analyzer and its imaging capabilities will be increased, and its design and operation will be simplified. An instrument such as this has many potential commercial applications. It would be useful in fields including surface phenomena analysis, environmental sciences, clinical analysis, catalysis, semiconductor testing, and drug screening.