SBIR Phase II: High Sensitivity Nanoprobe for Atomic and Molecular Imaging

9506463巴多这项研究的目标是开发一种高灵敏度的分析仪器，用于测定各种有机、无机和生物样品的化学成分。该仪器将采用飞秒激光后电离飞行时间二次离子质谱仪(TOF-SIMS)成像技术，以高于100纳米的空间分辨率绘制二维和三维地图。TOF-SIMS是表面质谱学的一种变体，已被先前的研究证明具有以预测的灵敏度进行成像的能力。在这一研究阶段，分析仪的灵敏度和成像能力将得到提高，其设计和操作将得到简化。像这样的仪器有很多潜在的商业应用。它将在表面现象分析、环境科学、临床分析、催化、半导体测试和药物筛选等领域发挥作用。

9506463 Bado The objective of this research is to develop a high-sensitivity analytical instrument for determining the chemical composition of various organic, inorganic, and biological samples. The instrument will employ the time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging technique with femtosecond laser post-ionization to map with spatial resolution better than 100 nanometers in two- and three-dimensions. TOF-SIMS is a variant of surface mass spectroscopy and has been proven through prior research to have the capability for imaging at the predicted sensitivity. In this research phase, the sensitivity of the analyzer and its imaging capabilities will be increased, and its design and operation will be simplified. An instrument such as this has many potential commercial applications. It would be useful in fields including surface phenomena analysis, environmental sciences, clinical analysis, catalysis, semiconductor testing, and drug screening.