采购用于纳米电子材料薄膜热性能无创测量以及温度和电学同步测量的设备...-猫眼课题宝

采购用于纳米电子材料薄膜热性能无创测量以及温度和电学同步测量的设备...

批准号：

9601570

负责人：

Peter Raad

金额：

$22.02万

依托单位：

Southern Methodist University

依托单位国家：

美国

项目类别：

Standard Grant

财政年份：

1996

资助国家：

美国

项目状态：

已结题

起止时间：

1996-09-01 至 1999-02-28

来源：

https://www.nsf.gov/awardsearch/showAward?AWD_ID=9601570&HistoricalAwards=false

关键词：

Acquisition Equipment Noninvasive Measurements Thin

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英文摘要

9601570 Raad The goal of the effort is to enable electronic designers to simulate thermal effects concurrently with electrical effects in the rapidly developing field submicron electronics identifying potential problems, and resolving them early in the design cycle in order to reduce design cycle time and to ensure device reliability through smart design. The requested equipment will be used to create (1) a laboratory facility for the measurement of the measurement of the thermal properties of thin film materials used in high-power, high-density integrated circuits, and (2) a microwave performance evaluation facility to perform simultaneous measurements of electrical and thermal characteristics of microwave monolithic integrated circuits. ***

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