Acquisition of Equipment for Noninvasive Measurements of Thin-Film Thermal Properties of Nanoelectronic Materials and Simultaneous Measurements of Temperature and Electrical...

采购用于纳米电子材料薄膜热性能无创测量以及温度和电学同步测量的设备...

• 批准号: 9601570
• 负责人: Peter Raad
• 金额: $ 22.02万
• 依托单位: Southern Methodist University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1996
• 资助国家: 美国
• 起止时间: 1996-09-01 至 1999-02-28
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9601570&HistoricalAwards=false
• 关键词: Acquisition; Equipment; Noninvasive; Measurements; Thin

9601570 Raad The goal of the effort is to enable electronic designers to simulate thermal effects concurrently with electrical effects in the rapidly developing field submicron electronics identifying potential problems, and resolving them early in the design cycle in order to reduce design cycle time and to ensure device reliability through smart design. The requested equipment will be used to create (1) a laboratory facility for the measurement of the measurement of the thermal properties of thin film materials used in high-power, high-density integrated circuits, and (2) a microwave performance evaluation facility to perform simultaneous measurements of electrical and thermal characteristics of microwave monolithic integrated circuits. ***

9601570 Raad的努力的目标是使电子设计人员能够同时模拟热效应与电效应在快速发展的领域亚微米电子识别潜在的问题，并解决他们在设计周期的早期，以减少设计周期时间，并通过智能设计确保设备的可靠性。 所要求的设备将用于：（1）建立一个测量高功率、高密度集成电路所用薄膜材料热特性的实验室设施;（2）建立一个微波性能评价设施，同时测量微波单片集成电路的电特性和热特性。 ***