Analysis of Diode Laser Facet Degradation

9614060 Mead 半导体二极管激光设备的可靠性评估对于长时间和具有挑战性的环境条件下的设备性能鉴定非常重要。 现代估计设备可靠性的方法通常仅限于经验公式，例如阿伦尼乌斯表达式。 这些方法通常是特定于供应商的，并且无法深入了解最影响寿命和长期可靠运行的环境因素。 本研究将研究一种利用器件的光谱和感兴趣区域中的声子光谱无损评估二极管激光端面退化的方法。 ***

9614060 Mead Reliability assessment of semiconductor diode laser devices will be important for qualification of device performance over extended periods and in challenging environmental settings. Contemporary methods of estimating device reliability are typically limited to empirical formulas such as the Arrhenius expression. These methods are often vendor specific and do not provide significant insight into environmental factors that most affect longevity and reliable operation of over long periods. This research will investigate a method for non-destructively assessing degradation of diode laser facets using the optical spectra of the device and phonon spectra in the region of interest. ***