Analysis of Diode Laser Facet Degradation

9614060米德半导体二极管激光器设备的可靠性评估将是重要的设备性能的资格在较长的时间内，并在具有挑战性的环境设置。 估计设备可靠性的当代方法通常限于经验公式，例如Arkyius表达式。 这些方法通常是特定于供应商的，并且不能提供对环境因素的显著洞察，这些环境因素对长时间的寿命和可靠操作影响最大。 本研究将探讨一种非破坏性地评估退化的二极管激光器小面使用的设备和声子谱的光学光谱在感兴趣的区域。 ***

9614060 Mead Reliability assessment of semiconductor diode laser devices will be important for qualification of device performance over extended periods and in challenging environmental settings. Contemporary methods of estimating device reliability are typically limited to empirical formulas such as the Arrhenius expression. These methods are often vendor specific and do not provide significant insight into environmental factors that most affect longevity and reliable operation of over long periods. This research will investigate a method for non-destructively assessing degradation of diode laser facets using the optical spectra of the device and phonon spectra in the region of interest. ***