Analysis of Diode Laser Facet Degradation

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9614060 Mead Reliability assessment of semiconductor diode laser devices will be important for qualification of device performance over extended periods and in challenging environmental settings. Contemporary methods of estimating device reliability are typically limited to empirical formulas such as the Arrhenius expression. These methods are often vendor specific and do not provide significant insight into environmental factors that most affect longevity and reliable operation of over long periods. This research will investigate a method for non-destructively assessing degradation of diode laser facets using the optical spectra of the device and phonon spectra in the region of interest. ***