CAREER: Reliability and Failure Analysis of Optoelectronic Devices

职业：光电器件的可靠性和故障分析

• 批准号: 9702329
• 负责人: Patricia Mead
• 金额: $ 29万
• 依托单位: University of Maryland, College Park
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1997
• 资助国家: 美国
• 起止时间: 1997-07-01 至 2001-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9702329&HistoricalAwards=false
• 关键词: CAREER; Reliability; Failure; Analysis; Optoelectronic

9702329 Mead In spite of the rapid developments in semiconductor laser performance and the expanding role that these devices now play in the optoelectronics industry, well defined models describing long term reliability and degradation processes continue to lag behind in their developments. As an example, several reports on the reliability of 980nm semiconductor lasers given over the past two years cite gradual degradation rates as observed from characteristic power-current (PI) curves obtained from long term continuous wave (CW) testing. Most often, the tests are performed at high temperature to accelerate the degradation process. This methodology treats the environmental temperature as a global parameter which initiates degradation, and it is assumed that an exponential relationship defines the rate at which degradation actually occurs. This research plan describes a rigorous experimental approach to development of reliability models for degradation of laser diode devices using Raman studies on devices which have been aged in a variety of environmental seetings. The approach is in agreement with a three step reliability model criteria designed to produce physics based models of device degradation. The academic plan includes a multifaceted approach that is designed to encourage participation of women and underrepresented students. The author has demonstrated a commitment to outreach programming and engineering curriculum transformation. These activities are enhanced through implementation of this research. ***

9702329 Mead尽管半导体激光器性能的快速发展，以及这些器件在光电子业中的作用日益扩大，但描述长期可靠性和退化过程的定义明确的模型在开发方面仍然落后。作为一个例子，过去两年关于980 nm半导体激光器可靠性的几份报告引用了从长期连续波(CW)测试获得的特征功率-电流(PI)曲线观察到的逐渐退化速率。大多数情况下，测试是在高温下进行的，以加速降解过程。这种方法将环境温度视为启动退化的全球参数，并假定指数关系定义了实际发生退化的速率。这项研究计划描述了一种严格的实验方法，通过对在各种环境下老化的器件进行拉曼研究，来开发激光二极管器件退化的可靠性模型。该方法与三步可靠性模型准则一致，该准则旨在产生基于物理的器件退化模型。该学术计划包括一种多方面的方法，旨在鼓励女性和代表性不足的学生参与。作者表现出了对外展规划和工程课程改革的承诺。通过实施这项研究，这些活动得到了加强。***