CAREER: Reliability and Failure Analysis of Optoelectronic Devices

9702329米德尽管在半导体激光器的性能和扩大的作用，这些设备现在在光电子工业中发挥的快速发展，良好定义的模型描述长期的可靠性和退化过程继续落后于他们的发展。 作为一个例子，在过去两年中给出的几个关于980 nm半导体激光器可靠性的报告引用了从长期连续波（CW）测试获得的特征功率-电流（PI）曲线观察到的逐渐退化率。 大多数情况下，测试在高温下进行，以加速降解过程。 该方法将环境温度视为引发降解的全局参数，并假设指数关系定义了实际发生降解的速率。 本研究计划描述了一个严格的实验方法，以发展的可靠性模型退化的激光二极管器件，使用拉曼研究的设备，已在各种环境seetings老化。 该方法是在协议的三个步骤的可靠性模型标准，旨在产生基于物理模型的器件退化。 学术计划包括一个多方面的方法，旨在鼓励妇女和代表性不足的学生参与。 作者已经证明了致力于推广编程和工程课程改革。 通过开展这项研究，这些活动得到了加强。 ***

9702329 Mead In spite of the rapid developments in semiconductor laser performance and the expanding role that these devices now play in the optoelectronics industry, well defined models describing long term reliability and degradation processes continue to lag behind in their developments. As an example, several reports on the reliability of 980nm semiconductor lasers given over the past two years cite gradual degradation rates as observed from characteristic power-current (PI) curves obtained from long term continuous wave (CW) testing. Most often, the tests are performed at high temperature to accelerate the degradation process. This methodology treats the environmental temperature as a global parameter which initiates degradation, and it is assumed that an exponential relationship defines the rate at which degradation actually occurs. This research plan describes a rigorous experimental approach to development of reliability models for degradation of laser diode devices using Raman studies on devices which have been aged in a variety of environmental seetings. The approach is in agreement with a three step reliability model criteria designed to produce physics based models of device degradation. The academic plan includes a multifaceted approach that is designed to encourage participation of women and underrepresented students. The author has demonstrated a commitment to outreach programming and engineering curriculum transformation. These activities are enhanced through implementation of this research. ***