STTR PHASE I: Diode-Pumpable Compact Blue Fiber Lasers for Optical Data Storage and Printing Applications

这个STTR一期项目描述了两种新颖的二极管泵浦、紧凑、高效的蓝色激光源设计。在高密度光数据存储、激光打印和自由空间光通信等许多应用中都需要这种光源。目前，这种紧凑和高效的源还没有商业上可用于这些应用。在这个建议中描述的设计是基于上转换激光在稀土掺杂氟锆酸盐（ZBLAN）玻璃纤维。第一种是Pr/Yb共掺光纤，这种光纤已经被证明可以在红、橙、绿、蓝波长下工作。蓝色激光输出功率，然而，由于竞争过渡从一个共同的上激光水平受到严重限制。我们对该问题的解决方案在本提案中进行了描述，并将进行测试和发展。本课题开发的第二种上转换蓝色光纤激光器是基于Tm掺杂ZBLAN光纤。这种激光器也已被证明，但缺乏一种方便的，可扩展的，基于二极管的泵源用于商业化。在本项目中，将开发和演示一种新型高效泵源。上述两种设计的原型激光系统将被构建和测试，以用于未来的发展。潜在的应用领域包括光学数据存储、打印应用、自由空间光通信、光学显示、光谱学、流式细胞术、分子生物学、高性能成像和半导体检测。* * *

*** 9632263 Xie This STTR Phase I propject describes two novel designs for diode-pumped, compact, efficient, blue laser sources. Such sources are needed in many applications including high density optical data storage, laser printing, and free space optical communication. Presently, such compact and efficient sources are not commercially available for these applications. The designs described in this proposal are based on upconversion lasing in rare-earth doped fluorozirconate (ZBLAN) glass fiber. The first is a Pr/Yb co-doped fiber which has previously been demonstrated as a laser operating at red, orange, green and blue wavelengths. The blue laser output power, however, was severely limited due to competing transitions from a common upper laser level. Our solution to the problem is described and will be tested and developed in this proposal. The second upconversion blue fiber laser to be developed in this proposal is based on Tm doped ZBLAN fiber. This laser has also been demonstrated, but lacks a convenient, scalable, diode-based pump source for commercialization. In this project, a novel and efficient pump source will be developed and demonstrated. Prototype laser systems for each of the two designs mentioned will be constructed and tested for future development Potential applications are in the fields of optical data storage, printing applications, free space optical communications, optical display, spectroscopy, flow cytometry, molecular biology, high performance imaging, and semiconductor inspection. ***