Upgrade of Scanning Probe Microscopy Facility

扫描探针显微镜设备升级

• 批准号: 9709273
• 负责人: Roger Willett
• 金额: $ 6.5万
• 依托单位: Washington State University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1997
• 资助国家: 美国
• 起止时间: 1997-09-01 至 2000-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9709273&HistoricalAwards=false
• 关键词: Upgrade; Scanning; Probe; Microscopy; Facility

*** 9709273 WILLETT This award from the Chemistry Research Instrumentation and Facilities Program (CRIF) will assist the Department of Chemistry at Washington State University acquire a scanning probe microscope (SPM). This equipment will enhance research in a number of areas including the study of the kinetics of growth of self assembled monolayers, the evaluation of forces at protein surfaces, the study of the enhanced deposition of materials controlled on the nanoscale by precisely applied stress, studies of molecular electronic materials, and determination of the orientation of deposited molecular films. The scanning probe microscope (SPM) enables researchers to image atoms directly. The technique uses the piezoelectric effect which involves bringing an extremely sharp metal needle within a few angstroms of the sample surface. The distance is small enough for electrons to leak or tunnel across the gap and generate a minute current. As the gap between the tip and the sample increases, the current decreases. As then probe crosses the sample, moving back and forth across its surface, it traces out a contour map of the sample's surface atoms. The SPM is used in the control of material used to fabricate semiconductor circuits. ***

*9709273威利特这项由化学研究仪器和设施计划授予的奖项将帮助华盛顿州立大学化学系获得扫描探针显微镜。该设备将加强一些领域的研究，包括自组装单分子层生长动力学的研究，蛋白质表面作用力的评估，通过精确施加应力在纳米尺度上控制材料的增强沉积的研究，分子电子材料的研究，以及沉积分子膜取向的确定。扫描探针显微镜(SPM)使研究人员能够直接对原子成像。这项技术利用了压电效应，将一根非常锋利的金属针带入样品表面几埃的范围内。距离足够小，电子可以泄漏或通过隧道穿过缝隙，产生微小的电流。随着针尖和样品之间的间隙增加，电流减小。当探测器穿过样品，在样品表面来回移动时，它会绘制出样品表面原子的等高线图。SPM用于控制用于制造半导体电路的材料。***