Upgrade of a Scanning Probe Microscopy Facility - LEED, Auger, and Sample Preparation

凭借化学研究仪器：多用户（CRIF：MU）计划的这一奖项，来自华盛顿州立大学的Kerry Hipps教授和合作者将升级扫描探针显微镜设施中的光谱仪器，其中包括超高真空扫描透射显微镜（UHV STM）。仪器将升级，增加一个用于低能电子衍射（LEED）和俄歇电子能谱（AES）的反向网格光学器件，样品制备室，制备室泵送和测量以及其他配件。该奖项将加强各级的研究培训和教育，特别是在以下研究领域：（a）自组装系统的结构和电子特性，（B）半导体纳米颗粒的表面缺陷和陷阱态，（c）有机纳米结构分析和光电导研究，和（d）聚合物的基本电子性质/超高真空扫描透射显微镜是一种用于在原子尺度上研究表面的分析方法，其提供补充其他公知的真空分析技术的图像。扫描电子显微镜，如在此奖项下升级的一个，使化学家能够探测材料的结构，具有非常高的空间分辨率和额外的化学和电子表征能力。当探测纳米材料的化学和物理性质时，这种细节水平是特别需要的，其中化学异质性恰好在这些长度尺度上变化。如果没有这样的细节水平，新型纳米材料的进展将慢得多。低能电子衍射（LEED）功能的增加将通过低能电子准直束的轰击增强对晶体材料表面结构的测定;衍射电子通常在荧光屏上以斑点的形式观察到。 在俄歇电子能谱中，分析从激发原子发射的高能电子以提供表面信息。这笔赠款提供的基础设施将用于教学和培训广泛的年轻科学家的重要，尖端，实验方法。

With this award from the Chemistry Research Instrumentation: Multi-user (CRIF:MU) program, Professor Kerry Hipps and collaborators from Washington State University will upgrade spectroscopic instrumentation in the scanning probe microscopy facility that includes an ultra high vacuum scanning transmission microscope (UHV STM). The instrumentation will be upgraded with addition of a reverse-view grid optics for low-energy-electron diffraction (LEED) and Auger electron spectroscopy (AES), sample preparation chamber, preparation chamber pumping and gauging as well as other accessories. The award will enhance research training and education at all levels, especially in areas of study such as (a) structure and electronic properties of self-assembled systems, (b) surface defects and trap states in semiconductor nanoparticles, (c) analysis of organic nanostructures and photoconductivity studies, and (d) fundamental electronic properties of polymer/metal and bimetallic interfaces.Ultra high vacuum scanning transmission microscopy is an analysis method for the study of surfaces on an atomic scale providing images that supplement other well-known vacuum analysis techniques. Scanning electron microscopes, like the one upgraded under this award, allow chemists to probe the structure of materials with extraordinarily high spatial resolution and with additional chemical and electronic characterization capabilities. This level of detail is especially needed when probing the chemical and physical properties of nanoscale materials, where the chemical heterogeneity changes at precisely these length scales. Without this level of detail, the progress towards new kinds of nanoscale materials will be made much more slowly. The addition of the low-energy electron diffraction (LEED) capabilities will enhance the determination of the surface structure of crystalline materials by bombardment with a collimated beam of low energy electrons; the diffracted electrons are generally observed as spots on a fluorescent screen. In Auger electron spectroscopy, energetic electrons emitted from an excited atom are analyzed to provide information on surfaces. The infrastructure made available with this grant will be used in teaching and training a broad range of young scientists in important, cutting-edge, experimental methods.