Upgrade of a Scanning Probe Microscopy Facility - LEED, Auger, and Sample Preparation

通过化学研究仪器：多用户（CRIF:MU）项目的奖励，Kerry Hipps教授和来自华盛顿州立大学的合作者将升级扫描探针显微镜设施中的光谱仪器，包括超高真空扫描透射显微镜（UHV STM）。仪器将升级，增加用于低能电子衍射（LEED）和俄格电子能谱（AES）的倒视网格光学，样品制备室，制备室泵送和测量以及其他附件。该奖项将加强各级的研究培训和教育，特别是在以下领域的研究：(a)自组装系统的结构和电子特性，(b)半导体纳米颗粒的表面缺陷和陷阱状态，(c)有机纳米结构分析和光电导率研究，以及(d)聚合物/金属和双金属界面的基本电子特性。超高真空扫描透射显微镜是一种在原子尺度上研究表面的分析方法，它提供的图像补充了其他著名的真空分析技术。扫描电子显微镜，就像在这个奖项下升级的那样，允许化学家以极高的空间分辨率探测材料的结构，并具有额外的化学和电子表征能力。当探测纳米材料的化学和物理性质时，这种程度的细节是特别需要的，因为纳米材料的化学非均质性正是在这些长度尺度上发生变化的。如果没有这种程度的细节，开发新型纳米材料的进程将会缓慢得多。低能电子衍射（LEED）能力的增加将增强用准直低能电子束轰击晶体材料表面结构的测定；衍射电子通常在荧光屏上以斑点的形式被观察到。在俄歇电子能谱中，从受激原子发射的高能电子被分析以提供表面上的信息。这项资助提供的基础设施将用于教学和培训广泛的年轻科学家，使他们掌握重要的、前沿的实验方法。

With this award from the Chemistry Research Instrumentation: Multi-user (CRIF:MU) program, Professor Kerry Hipps and collaborators from Washington State University will upgrade spectroscopic instrumentation in the scanning probe microscopy facility that includes an ultra high vacuum scanning transmission microscope (UHV STM). The instrumentation will be upgraded with addition of a reverse-view grid optics for low-energy-electron diffraction (LEED) and Auger electron spectroscopy (AES), sample preparation chamber, preparation chamber pumping and gauging as well as other accessories. The award will enhance research training and education at all levels, especially in areas of study such as (a) structure and electronic properties of self-assembled systems, (b) surface defects and trap states in semiconductor nanoparticles, (c) analysis of organic nanostructures and photoconductivity studies, and (d) fundamental electronic properties of polymer/metal and bimetallic interfaces.Ultra high vacuum scanning transmission microscopy is an analysis method for the study of surfaces on an atomic scale providing images that supplement other well-known vacuum analysis techniques. Scanning electron microscopes, like the one upgraded under this award, allow chemists to probe the structure of materials with extraordinarily high spatial resolution and with additional chemical and electronic characterization capabilities. This level of detail is especially needed when probing the chemical and physical properties of nanoscale materials, where the chemical heterogeneity changes at precisely these length scales. Without this level of detail, the progress towards new kinds of nanoscale materials will be made much more slowly. The addition of the low-energy electron diffraction (LEED) capabilities will enhance the determination of the surface structure of crystalline materials by bombardment with a collimated beam of low energy electrons; the diffracted electrons are generally observed as spots on a fluorescent screen. In Auger electron spectroscopy, energetic electrons emitted from an excited atom are analyzed to provide information on surfaces. The infrastructure made available with this grant will be used in teaching and training a broad range of young scientists in important, cutting-edge, experimental methods.