Upgrade of a Scanning Probe Microscopy Facility - LEED, Auger, and Sample Preparation

有了化学研究仪器：多用户(CRIF：MU)计划颁发的这一奖项，来自华盛顿州立大学的Kerry Hipps教授和他的合作者将升级扫描探针显微镜设施中的光谱仪器，其中包括一台超高真空扫描透射式显微镜(UHV STM)。仪器将进行升级，增加用于低能电子衍射(LEED)和俄歇电子能谱(AES)的反向观察栅格光学元件、样品制备室、制备室泵送和测量以及其他附件。该奖项将加强所有层面的研究培训和教育，特别是在以下研究领域：(A)自组装系统的结构和电子性质，(B)半导体纳米粒子中的表面缺陷和陷阱状态，(C)有机纳米结构分析和光电导研究，以及(D)聚合物/金属和双金属界面的基本电子性质。超高真空扫描透射显微镜是一种在原子尺度上研究表面的分析方法，提供图像，补充其他众所周知的真空分析技术。扫描电子显微镜，如本奖项下升级的扫描电子显微镜，使化学家能够以极高的空间分辨率探测材料的结构，并具有额外的化学和电子表征能力。在探索纳米材料的化学和物理性质时，特别需要这种详细程度，因为化学异质性恰好在这些长度尺度上发生变化。如果没有这种程度的细节，新型纳米材料的进展将会缓慢得多。低能电子衍射(LEED)能力的增加将通过用准直的低能电子束轰击晶体材料的表面结构来增强测定；衍射电子通常作为荧光屏上的斑点被观察到。在俄歇电子能谱中，从一个被激发的原子发出的高能电子被分析以提供表面信息。用这笔赠款提供的基础设施将用于在重要的、尖端的实验方法方面对广泛的年轻科学家进行教学和培训。

With this award from the Chemistry Research Instrumentation: Multi-user (CRIF:MU) program, Professor Kerry Hipps and collaborators from Washington State University will upgrade spectroscopic instrumentation in the scanning probe microscopy facility that includes an ultra high vacuum scanning transmission microscope (UHV STM). The instrumentation will be upgraded with addition of a reverse-view grid optics for low-energy-electron diffraction (LEED) and Auger electron spectroscopy (AES), sample preparation chamber, preparation chamber pumping and gauging as well as other accessories. The award will enhance research training and education at all levels, especially in areas of study such as (a) structure and electronic properties of self-assembled systems, (b) surface defects and trap states in semiconductor nanoparticles, (c) analysis of organic nanostructures and photoconductivity studies, and (d) fundamental electronic properties of polymer/metal and bimetallic interfaces.Ultra high vacuum scanning transmission microscopy is an analysis method for the study of surfaces on an atomic scale providing images that supplement other well-known vacuum analysis techniques. Scanning electron microscopes, like the one upgraded under this award, allow chemists to probe the structure of materials with extraordinarily high spatial resolution and with additional chemical and electronic characterization capabilities. This level of detail is especially needed when probing the chemical and physical properties of nanoscale materials, where the chemical heterogeneity changes at precisely these length scales. Without this level of detail, the progress towards new kinds of nanoscale materials will be made much more slowly. The addition of the low-energy electron diffraction (LEED) capabilities will enhance the determination of the surface structure of crystalline materials by bombardment with a collimated beam of low energy electrons; the diffracted electrons are generally observed as spots on a fluorescent screen. In Auger electron spectroscopy, energetic electrons emitted from an excited atom are analyzed to provide information on surfaces. The infrastructure made available with this grant will be used in teaching and training a broad range of young scientists in important, cutting-edge, experimental methods.