Upgrade of Scanning Probe Microscopy System

该奖项由化学研究仪器和设施 计划（CRIF）将协助化学系在大学 迈阿密获得扫描探针显微镜（SPM）。该设备将 加强若干领域的研究，包括：（1） 富勒烯衍生物的单分子膜，（2）电化学， 超分子体系，（3）Langmuir和Langmuir-Blodgett膜，（4） 三嗪巴比妥酸氢盐的扫描探针显微镜研究 键合的自组装复合物，以及（5）化学和酶促的 寡糖-二乙炔脂质缀合物的合成。 扫描探针显微镜（SPM）使研究人员能够对原子进行成像 直接.该技术利用压电效应， 把一个非常锋利的金属针带到几埃的范围内， 样品表面距离足够小，电子可以泄漏， 穿过差距并产生微小电流。由于两个国家之间的差距 尖端和样品增加，电流减小。当探测器 穿过样品，在其表面来回移动， 画出样品表面原子的等高线图。AFM用于 半导体电路制造材料的控制 ¥ ¥Â │©Á_╣¢¥╝`

This award from the Chemistry Research Instrumentation and Facilities Program (CRIF) will assist the Department of Chemistry at University of Miami acquire a scanning probe microscope (SPM). This equipment will enhance research in a number of areas including the following: (1) monolayers of fullerene derivatives, (2) electrochemistry of supramolecular systems, (3) Langmuir and Langmuir-Blodgett films, (4) scanning probe microscopic studies of triazine-barbiturate hydrogen bonded self-assembled complexes, and (5) chemical and enzymatic synthesis of oligosaccharides-diacetylene lipid conjugates. The scanning probe microscope (SPM) enables researchers to image atoms directly. The technique uses the piezoelectric effect which involves bringing an extremely sharp metal needle within a few angstroms of the sample surface. The distance is small enough for electrons to leak or tunnel across the gap and generate a minute current. As the gap between the tip and the sample increases, the current decreases. As then probe crosses the sample, moving back and forth across its surface, it traces out a contour map of the sample's surface atoms. The AFM is used in the control of material used to fabricate semiconductor circuits ¥╣Á╝ ╝Á¢Á/╝│© ╣ _/` Â╣Á%┤¢ ? │©Á_╣¢¥╝`