Acquisition of a Digital Imaging System for Advanced Transmission Electron Microscopy of Nanostructured Materials

获取用于纳米结构材料的先进透射电子显微镜的数字成像系统

• 批准号: 0076504
• 负责人: Yi Liu
• 金额: $ 7.05万
• 依托单位: University of Nebraska-Lincoln
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2000
• 资助国家: 美国
• 起止时间: 2000-08-01 至 2001-07-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0076504&HistoricalAwards=false
• 关键词: Acquisition; Digital; Imaging; System; Advanced

0076504LiuThis is an award to the University of Nebraska-Lincoln for the acquisition of a digital imaging system for Transmission electron microscopy (TEM). The instrument will be fitted on an existing JEOL 2010 TEM to develop two new techniques, super-resolution TEM, (SRTEM) and selected reflection imaging (SRI). This will make it possible to develop a simple but an effective model to extend the resolution of TEM micrograph through post image processing. The first method only involves Fourier transform and image summation. With this method, images with 0.15 nanometer resolution are routinely obtained with this method. The second technique consists in selected reflection imaging for nanostructured materials characterization. This technique uses a single ring in the electron diffraction pattern to form the image. A small aperture and illumination tilting are used to achieve the experimental set-up in a conventional TEM. Preliminary results obtained using conventional JEOL 2010 TEM indicate that this technique has the advantage of easy operation, and instant results. Measurement of nano-particle size, phase identification and volume fraction measurement in dual phase materials will be possible.This grant is to support acquisition of a digital imaging system, a sophisticated system which will be a tremendous improvement in terms of resolution, as well as ability to record the images and later analyze them, over the current facilities. The instrument is best suited for research at the small nanotechnology scale.

0076504Liu这是内布拉斯加大学林肯分校获得的用于透射电子显微镜 (TEM) 的数字成像系统的奖项。该仪器将安装在现有的 JEOL 2010 TEM 上，以开发两种新技术：超分辨率 TEM (SRTEM) 和选择性反射成像 (SRI)。这将使得开发一个简单但有效的模型成为可能，通过图像后处理来扩展 TEM 显微照片的分辨率。第一种方法仅涉及傅里叶变换和图像求和。通过这种方法，通常可以获得0.15纳米分辨率的图像。第二种技术包括用于纳米结构材料表征的选定反射成像。 该技术使用电子衍射图案中的单个环来形成图像。 使用小孔径和照明倾斜来实现传统 TEM 中的实验设置。 使用传统 JEOL 2010 TEM 获得的初步结果表明，该技术具有操作简单、结果即时的优点。 双相材料中的纳米颗粒尺寸、相识别和体积分数测量将成为可能。这笔赠款将用于支持数字成像系统的购置，这是一个复杂的系统，与现有设施相比，它将在分辨率以及记录图像和随后分析图像的能力方面取得巨大改进。 该仪器最适合小型纳米技术规模的研究。