Acquisition of a Digital Imaging System for Advanced Transmission Electron Microscopy of Nanostructured Materials

这是内布拉斯加大学林肯分校获得透射电子显微镜（TEM）数字成像系统的合同。该仪器将安装在现有的JEOL 2010 TEM上，以开发两种新技术，超分辨率TEM （SRTEM）和选择反射成像（SRI）。这将为建立一种简单而有效的模型，通过后期图像处理来扩展TEM显微图像的分辨率提供可能。第一种方法只涉及傅里叶变换和图像求和。使用该方法，常规获得0.15纳米分辨率的图像。第二种技术包括选择反射成像用于纳米结构材料的表征。这种技术使用电子衍射图中的单个环来形成图像。在传统的瞬变电磁法中，采用小孔径和照明倾斜来实现实验装置。用JEOL 2010 TEM进行的初步实验结果表明，该方法具有操作简单、见效快等优点。在双相材料中测量纳米粒度、相识别和体积分数将成为可能。这笔拨款是为了支持购置一套数字成像系统，这是一套复杂的系统，在现有设备的基础上，它将在分辨率以及记录图像和随后分析图像的能力方面有巨大的改进。该仪器最适合于小型纳米技术规模的研究。

0076504LiuThis is an award to the University of Nebraska-Lincoln for the acquisition of a digital imaging system for Transmission electron microscopy (TEM). The instrument will be fitted on an existing JEOL 2010 TEM to develop two new techniques, super-resolution TEM, (SRTEM) and selected reflection imaging (SRI). This will make it possible to develop a simple but an effective model to extend the resolution of TEM micrograph through post image processing. The first method only involves Fourier transform and image summation. With this method, images with 0.15 nanometer resolution are routinely obtained with this method. The second technique consists in selected reflection imaging for nanostructured materials characterization. This technique uses a single ring in the electron diffraction pattern to form the image. A small aperture and illumination tilting are used to achieve the experimental set-up in a conventional TEM. Preliminary results obtained using conventional JEOL 2010 TEM indicate that this technique has the advantage of easy operation, and instant results. Measurement of nano-particle size, phase identification and volume fraction measurement in dual phase materials will be possible.This grant is to support acquisition of a digital imaging system, a sophisticated system which will be a tremendous improvement in terms of resolution, as well as ability to record the images and later analyze them, over the current facilities. The instrument is best suited for research at the small nanotechnology scale.