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Radiative Properties and Optical Response of High-Temperature Superconducting Thin-Film Materials and Devices

Radiative Properties and Optical Response of High-Temperature Superconducting Thin-Film Materials and Devices
高温超导薄膜材料与器件的辐射特性和光学响应
批准号:
0082969
负责人:
David Tanner
金额:
$23.65万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2000
资助国家:
美国
项目状态:
已结题
起止时间:
2000-11-15 至 2004-10-31

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中文摘要
翻译
摘要提案ID:0082969标题: 高温超导薄膜材料和器件的辐射特性和光学响应。Zhang和D.B.坦纳,佛罗里达大学转变温度高于77 K的高温超导(HTS)薄膜在量子电子学、微波和红外器件中有许多应用。然而,由于其复杂的化学结构,这些材料中的电子-电子,电子-声子和电子-缺陷相互作用尚未完全了解。了解高温超导薄膜的光学响应和输运机制对于许多有前景的应用至关重要,例如红外辐射探测器和调制器。本计画利用红外线光谱来研究薄膜厚度、微结构与偏压电流对辐射特性的影响。此外,还将利用同步辐射光源测量高温超导薄膜在皮秒光激发后远红外反射率的快速变化。可调谐法布里-珀罗谐振器将建立从高温超导薄膜使用压电控制器。实验结果将被分析,以研究准粒子动力学和低频剩余损耗。薄膜-衬底界面处的热边界电阻将使用简化的动力学理论模型从时间分辨测量确定。 从这个NSF项目的支持允许两个研究生的跨学科教育,并为几个本科生提供研究经验。
英文摘要
AbstractProposal ID: 0082969Title: Radiative Properties and Optical Response of High-Temperature Superconducting Thin-Film Materials and DevicesPIs: Z. Zhang and D.B. Tanner, University of FloridaHigh-temperature superconducting (HTS) films with transition temperatures above 77 K have numerous applications in quantum electronics, microwave and infrared devices. However, because of their complex chemical structure, the electron-electron, electron-phonon and electron-defect interactions in these materials have not been fully understood. Understanding the optical response and transport mechanisms in HTS films is crucial for many promising applications, such as infrared radiation detectors and modulators. This project uses infrared spectroscopy to examine the effects of film thickness, microstructure, and bias currents on the radiative properties. In addition, a synchrotron radiation source will be employed to measure the rapid changes of far-infrared reflectance of HTS films after picosecond optical excitations. Tunable Fabry-Perot resonators will be built from HTS films using a piezoelectric controller. The experimental results will be analyzed to study the quasiparticle dynamics and low-frequency residual losses. The thermal boundary resistance at the film-substrate interface will be determined from time-resolved measurements using a simplified kinetic-theory model. Support from this NSF project allows cross-disciplinary education of two graduate students and provide research experience for several undergraduates.
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