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Radiative Properties and Optical Response of High-Temperature Superconducting Thin-Film Materials and Devices

Radiative Properties and Optical Response of High-Temperature Superconducting Thin-Film Materials and Devices
高温超导薄膜材料与器件的辐射特性和光学响应
批准号:
0082969
负责人:
David Tanner
金额:
$23.65万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2000
资助国家:
美国
项目状态:
已结题
起止时间:
2000-11-15 至 2004-10-31

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中文摘要
翻译
摘要提案ID:0082969标题:高温超导薄膜材料和器件的辐射特性和光学响应PI:Z.Zhang和D.B. Tanner,佛罗里达大学转变温度高于 77 K 的高温超导 (HTS) 薄膜在量子电子、微波和红外设备中具有广泛的应用。然而,由于其复杂的化学结构,这些材料中的电子-电子、电子-声子和电子-缺陷相互作用尚未被完全理解。了解高温超导薄膜的光学响应和传输机制对于许多有前途的应用(例如红外辐射探测器和调制器)至关重要。该项目使用红外光谱来检查薄膜厚度、微观结构和偏置电流对辐射特性的影响。此外,还将采用同步辐射源来测量HTS薄膜在皮秒光激发后远红外反射率的快速变化。可调谐法布里-珀罗谐振器将使用压电控制器由高温超导薄膜制成。将分析实验结果以研究准粒子动力学和低频残余损耗。薄膜-基底界面处的热边界电阻将使用简化的动力学理论模型通过时间分辨测量来确定。 该 NSF 项目的支持允许对两名研究生进行跨学科教育,并为几名本科生提供研究经验。
英文摘要
AbstractProposal ID: 0082969Title: Radiative Properties and Optical Response of High-Temperature Superconducting Thin-Film Materials and DevicesPIs: Z. Zhang and D.B. Tanner, University of FloridaHigh-temperature superconducting (HTS) films with transition temperatures above 77 K have numerous applications in quantum electronics, microwave and infrared devices. However, because of their complex chemical structure, the electron-electron, electron-phonon and electron-defect interactions in these materials have not been fully understood. Understanding the optical response and transport mechanisms in HTS films is crucial for many promising applications, such as infrared radiation detectors and modulators. This project uses infrared spectroscopy to examine the effects of film thickness, microstructure, and bias currents on the radiative properties. In addition, a synchrotron radiation source will be employed to measure the rapid changes of far-infrared reflectance of HTS films after picosecond optical excitations. Tunable Fabry-Perot resonators will be built from HTS films using a piezoelectric controller. The experimental results will be analyzed to study the quasiparticle dynamics and low-frequency residual losses. The thermal boundary resistance at the film-substrate interface will be determined from time-resolved measurements using a simplified kinetic-theory model. Support from this NSF project allows cross-disciplinary education of two graduate students and provide research experience for several undergraduates.
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