CAREER: Spectral Techniques for Functional Testing of Sequential Circuits and System-On-A-Chip

虽然目前的电路测试技术受到不断增加的电路尺寸的限制，但提出的研究探索了一种基于频谱的测试生成的新概念，以应对日益庞大和复杂的电路测试。一种最先进的基于频谱的芯片功能测试技术正在探索中，该技术在很短的执行时间内实现了极高的故障覆盖率。在这种方法中，电路被视为可由其输入-输出特性识别的系统，而不是传统的原语网表。对被测系统的输入/输出信号进行频谱特征提取和分析，并将得到的数据用于预测和构造智能测试码。此外，这种功能谱知识还为内建自测试(BIST)提供了新的手段，同样适用于片上系统。这项研究解决了基于频谱的测试框架中的相关问题：(A)为给定电路开发各种频谱提取技术；(B)分析不同的频谱基数(正交和非正交)以及它们如何影响测试的频谱特性；以及(C)应用变换域识别主要频率分量，以生成智能模式。

While current circuit testing techniques are limited by the increasing circuit size, the proposed research explores a new concept of spectrum-based test generation to tackle testing of increasingly large and complex circuits. A state-of-the-art spectrum-based technique for chip functional testing is being explored that achieves extremely high fault coverages in short execution times. In this approach, the circuit is viewed as a system identifiable by its input-output characteristics instead of a traditional netlist of primitives. Spectral characteristics are extracted and analyzed for the input/output signals of the system under test, and the resulting data are used to predict and construct intelligent test patterns. In addition, this functional spectral knowledge also provides new means for built-in-self-test (BIST), applicable also for system-on-a-chip. This research addresses the relevant issues in the spectrum-based testing framework: (a) the development of various techniques for spectral extraction for a given circuit; (b) the analysis of different spectral bases (orthogonal and non-orthogonal) and how they can influence spectral characteristics for testing; and (c) the application of transform domain to identify dominant frequency components to generate intelligent patterns.