CAREER: Spectral Techniques for Functional Testing of Sequential Circuits and System-On-A-Chip

虽然目前的电路测试技术是有限的，不断增加的电路尺寸，拟议的研究探讨了一个新的概念，基于频谱的测试生成，以解决日益庞大和复杂的电路测试。 一个国家的最先进的频谱为基础的技术芯片功能测试正在探索，实现极高的故障覆盖率在短的执行时间。在这种方法中，电路被视为一个系统，可识别的输入输出特性，而不是传统的网表的原语。 对被测系统的输入/输出信号进行频谱特征提取和分析，并利用得到的数据预测和构造智能测试模式。此外，这种功能谱知识还提供了用于内建自测试（BIST）的新手段，也适用于片上系统。 本研究解决了基于频谱的测试框架中的相关问题：（a）针对给定电路开发各种频谱提取技术;（B）分析不同的频谱基础（正交和非正交）以及它们如何影响测试的频谱特性;以及（c）应用变换域来识别主频率分量以生成智能模式。

While current circuit testing techniques are limited by the increasing circuit size, the proposed research explores a new concept of spectrum-based test generation to tackle testing of increasingly large and complex circuits. A state-of-the-art spectrum-based technique for chip functional testing is being explored that achieves extremely high fault coverages in short execution times. In this approach, the circuit is viewed as a system identifiable by its input-output characteristics instead of a traditional netlist of primitives. Spectral characteristics are extracted and analyzed for the input/output signals of the system under test, and the resulting data are used to predict and construct intelligent test patterns. In addition, this functional spectral knowledge also provides new means for built-in-self-test (BIST), applicable also for system-on-a-chip. This research addresses the relevant issues in the spectrum-based testing framework: (a) the development of various techniques for spectral extraction for a given circuit; (b) the analysis of different spectral bases (orthogonal and non-orthogonal) and how they can influence spectral characteristics for testing; and (c) the application of transform domain to identify dominant frequency components to generate intelligent patterns.