MRI: Acquisition of a Transmission Electron Microscope for Multi-disciplinary Research and Education

MRI：购买透射电子显微镜用于多学科研究和教育

• 批准号: 0216308
• 负责人: Ashok Kumar
• 金额: $ 41.42万
• 依托单位: University of South Florida
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2002
• 资助国家: 美国
• 起止时间: 2002-09-01 至 2005-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0216308&HistoricalAwards=false
• 关键词: MRI; Acquisition; Transmission; Electron; Microscope

This Major Research Instrumentation (MRI) award is to purchase a fully analytical JEM-2010 transmission electron microscope (TEM). The JEM-2010 is a multipurpose high-resolution analytical microscope with wide range of capabilities, such as high-resolution image observation, microarea X-ray analysis, versatile analysis by convergent-beam electron diffraction, and analysis of the atomic structure and/or bonding state of atoms. The primary TEM system will comprise: (i) a TEM with a high resolution pole piece for high resolution electron microscopy imaging (HREM) and convergent beam electron diffraction (CBED), (ii) a scanning transmission electron microscopy (STEM) accessory, (iii) an energy dispersive X-ray spectrometer (EDS), (iv) an electron energy loss spectrometer (EELS) with an energy filter, and (v) a multichannel analyzer and support computers for data acquisition, storage, and processing. This instrument is capable of high spatial resolution imaging of crystalline and amorphous structures, small-beam electron diffraction, and compositional and spectroscopic analyses of micro-and nano-scale features, all necessary tools for characterizing materials structure. Numerous new scientific investigations will be enabled with the new equipment. This instrument will support research in a variety of materials systems including nanomaterials, semiconductors, ceramics, metals, polymers, biomaterials and mesoporous materials. The proposed research projects cover a broad area of research related to synthesis and characterization of high-performance materials for manufacturing applications and TEM will provide an opportunity to conduct high-quality research to understand the microstructural properties of the materials.The proposed TEM instrument will not only stimulate the productivity of the existing research projects related to the characterization of materials but also will be used for educational purposes. The instrument will be used in undergraduate and graduate courses, and in outreach program for minority students from local schools. It will thus allow for research training of future scientists and engineers from diverse backgrounds in current techniques of electron microscopy and state-of-the-art instrumentation. A laboratory course will be introduced and the main purpose is to provide students hands-on experience starting from sample preparations to operations of TEM. Support for a TEM instrument will also allow the development and enhancement of creative partnership with the numerous local industries, including microelectronics manufacturing, optical coating manufacturing, biomedical company, and computer hardware company. Results of the project will be disseminated by paper presentation in regional and national conferences, and published in journals.

该重大研究仪器 (MRI) 奖项用于购买一台完全分析的 JEM-2010 透射电子显微镜 (TEM)。 JEM-2010 是一款多功能高分辨率分析显微镜，具有多种功能，例如高分辨率图像观察、微区 X 射线分析、会聚束电子衍射的多功能分析以及原子结构和/或原子键合状态分析。主 TEM 系统将包括：(i) 具有用于高分辨率电子显微镜成像 (HREM) 和会聚束电子衍射 (CBED) 的高分辨率极片的 TEM，(ii) 扫描透射电子显微镜 (STEM) 附件，(iii) 能量色散 X 射线光谱仪 (EDS)，(iv) 带有能量滤波器的电子能量损失光谱仪 (EELS)，以及 (v) 多通道分析仪和支持计算机进行数据采集、存储和处理。该仪器能够对晶体和非晶结构进行高空间分辨率成像、小束电子衍射以及微米和纳米尺度特征的成分和光谱分析，这些都是表征材料结构的必要工具。 新设备将能够进行许多新的科学研究。该仪器将支持各种材料系统的研究，包括纳米材料、半导体、陶瓷、金属、聚合物、生物材料和介孔材料。拟议的研究项目涵盖了与制造应用的高性能材料的合成和表征相关的广泛研究领域，而 TEM 将提供进行高质量研究以了解材料的微观结构特性的机会。拟议的 TEM 仪器不仅将提高与材料表征相关的现有研究项目的生产力，而且还将用于教育目的。 该工具将用于本科生和研究生课程，以及当地学校少数民族学生的外展项目。因此，它将允许对来自不同背景的未来科学家和工程师进行当前电子显微镜技术和最先进仪器的研究培训。将引入实验室课程，主要目的是为学生提供从样品制备到TEM操作的实践经验。对 TEM 仪器的支持还将有助于发展和加强与众多当地行业的创造性合作伙伴关系，包括微电子制造、光学镀膜制造、生物医学公司和计算机硬件公司。该项目的成果将通过在区域和国家会议上发表论文并在期刊上发表来传播。