MRI: Acquisition of a Transmission Electron Microscope for Multi-disciplinary Research and Education

MRI：购买透射电子显微镜用于多学科研究和教育

• 批准号: 0216308
• 负责人: Ashok Kumar
• 金额: $ 41.42万
• 依托单位: University of South Florida
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2002
• 资助国家: 美国
• 起止时间: 2002-09-01 至 2005-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0216308&HistoricalAwards=false
• 关键词: MRI; Acquisition; Transmission; Electron; Microscope

This Major Research Instrumentation (MRI) award is to purchase a fully analytical JEM-2010 transmission electron microscope (TEM). The JEM-2010 is a multipurpose high-resolution analytical microscope with wide range of capabilities, such as high-resolution image observation, microarea X-ray analysis, versatile analysis by convergent-beam electron diffraction, and analysis of the atomic structure and/or bonding state of atoms. The primary TEM system will comprise: (i) a TEM with a high resolution pole piece for high resolution electron microscopy imaging (HREM) and convergent beam electron diffraction (CBED), (ii) a scanning transmission electron microscopy (STEM) accessory, (iii) an energy dispersive X-ray spectrometer (EDS), (iv) an electron energy loss spectrometer (EELS) with an energy filter, and (v) a multichannel analyzer and support computers for data acquisition, storage, and processing. This instrument is capable of high spatial resolution imaging of crystalline and amorphous structures, small-beam electron diffraction, and compositional and spectroscopic analyses of micro-and nano-scale features, all necessary tools for characterizing materials structure. Numerous new scientific investigations will be enabled with the new equipment. This instrument will support research in a variety of materials systems including nanomaterials, semiconductors, ceramics, metals, polymers, biomaterials and mesoporous materials. The proposed research projects cover a broad area of research related to synthesis and characterization of high-performance materials for manufacturing applications and TEM will provide an opportunity to conduct high-quality research to understand the microstructural properties of the materials.The proposed TEM instrument will not only stimulate the productivity of the existing research projects related to the characterization of materials but also will be used for educational purposes. The instrument will be used in undergraduate and graduate courses, and in outreach program for minority students from local schools. It will thus allow for research training of future scientists and engineers from diverse backgrounds in current techniques of electron microscopy and state-of-the-art instrumentation. A laboratory course will be introduced and the main purpose is to provide students hands-on experience starting from sample preparations to operations of TEM. Support for a TEM instrument will also allow the development and enhancement of creative partnership with the numerous local industries, including microelectronics manufacturing, optical coating manufacturing, biomedical company, and computer hardware company. Results of the project will be disseminated by paper presentation in regional and national conferences, and published in journals.

该主要研究仪器（MRI）奖将购买一台全分析的JEM-2010透射电子显微镜（TEM）。JEM-2010是一种多用途高分辨率分析显微镜，具有广泛的功能，如高分辨率图像观察，微区x射线分析，通过会聚束电子衍射进行多功能分析，以及原子结构和/或原子键合状态分析。主TEM系统将包括：(i)带有高分辨率极片的TEM，用于高分辨率电子显微镜成像（HREM）和汇聚束电子衍射（CBED）， （ii）扫描透射电子显微镜（STEM）附件，（iii）能量色散x射线光谱仪（EDS）， （iv）带有能量滤波器的电子能量损失光谱仪（EELS），以及(v)多通道分析仪和用于数据采集，存储和处理的支持计算机。该仪器能够进行晶体和非晶结构的高空间分辨率成像，小束电子衍射，以及微观和纳米尺度特征的成分和光谱分析，这些都是表征材料结构的必要工具。新设备将使许多新的科学研究成为可能。该仪器将支持各种材料系统的研究，包括纳米材料、半导体、陶瓷、金属、聚合物、生物材料和介孔材料。拟议的研究项目涵盖了与制造应用的高性能材料的合成和表征相关的广泛研究领域，TEM将提供进行高质量研究的机会，以了解材料的微观结构特性。提议的瞬变电磁法仪器不仅将促进现有材料特性研究项目的生产力，而且还将用于教育目的。该工具将用于本科和研究生课程，以及为当地学校的少数民族学生提供的外展计划。因此，它将允许来自不同背景的未来科学家和工程师在当前电子显微镜技术和最先进仪器方面进行研究培训。本课程将介绍实验课程，主要目的是为学生提供从样品制备到TEM操作的动手经验。对TEM仪器的支持也将允许发展和加强与众多当地工业的创造性伙伴关系，包括微电子制造业，光学涂层制造业，生物医学公司和计算机硬件公司。该项目的成果将在区域和国家会议上以论文形式传播，并在期刊上发表。