Technical Support for a Dual Beam Focused Ion Milling System for TEM Foil Preparation + 3D Chemical Analysis

用于 TEM 箔制备 3D 化学分析的双束聚焦离子铣削系统的技术支持

• 批准号: 0521896
• 负责人: Harry Green
• 金额: $ 22.5万
• 依托单位: University of California-Riverside
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2005
• 资助国家: 美国
• 起止时间: 2005-10-01 至 2010-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0521896&HistoricalAwards=false
• 关键词: Technical; Support; Dual; Beam; Focused

0521896GreenThis award partially funds a high-level full-time technician to operate and maintain a Focused Ion Beam / Scanning Electron Microscope instrument. This position is essential for enabling the national geophysics support program planned for this instrument. The FIB/SEM, with purchase cost greater than $1M, has been purchased for nanomaterials research on the UC Riverside campus. Provision of this technician will enable shared use of the instrument as a "partnership" between UC Riverside and the NSF via the COnsortium for Mineral Properties Research in Earth Sciences (COMPRES) to provide access for members of COMPRES institutions to a FIB/SEM instrument for "mail-order" specimen preparation for transmission electron microscopy (TEM). User fees will be charged to all users but the NSF support of this technician will significantly defray costs to users in geology/geophysics. This concept has been endorsed by COMPRES, which has granted additional funds toward the yearly cost of the program. Although many advances in geology and geophysics (and in particular in mineral and rock physics) have been achieved through use of TEM since development of the ion-bombardment thinner in the late 1960s, application of TEM has been significantly constrained by the great difficulty and time involved in specimen preparation. Development of the FIB/SEM instrument now allows preparation of TEM specimens ("foils") from precisely located sites on polished surfaces of essentially any inorganic material and at least some organic materials (polymers). The fundamental problem facing wide-spread use of such instrumentation in all branches of the Earth Sciences that deal with solids has been the very high cost of the instrument, its similarly high annual maintenance costs, and the need for a highly-trained, dedicated technician to operate it. The partnership being established with the funding of this technician will now circumvent these problems, leading to a much lower cost than current commercial availability. It is estimated that a price of ~$100/foil will be attainable when the program is fully operational.

0521896-Greenthis奖部分为高级全职技术人员提供了资金，以操作和维护重点的离子光束 /扫描电子显微镜仪器。该职位对于启用该工具计划的国家地球物理支持计划至关重要。 购买成本超过100万美元的FIB/SEM已在UC Riverside校园购买纳米材料研究。 该技术人员的提供将使该乐器通过联盟通过财团进行地球科学研究（Compres）的矿产财产研究联盟（Compres），将仪器作为“伙伴关系”的共同使用，以为机构的成员提供访问机构的fib/sem仪器的“邮件顺序”样本准备的FIB/SEM仪器，用于传输电子显微镜（TEM）。用户费用将向所有用户收取费用，但是该技术人员的NSF支持将大大支付地质/地球物理学的用户费用。 这个概念得到了综合的认可，该概念已为该计划的年度成本提供了额外的资金。 尽管自1960年代后期开发离子炸弹以来，通过使用TEM来实现地质和地球物理学（尤其是矿物质和岩石物理学）的许多进步（尤其是在矿物和岩石物理学中），但TEM的应用已受到标本制备中涉及的极大困难和时间的限制。现在，FIB/SEM仪器的开发允许从基本上任何无机材料和至少一些有机材料（聚合物）的抛光表面上精确位置的TEM样品（“箔”）制备。在与固体相关的所有分支机构中广泛使用此类仪器面临的基本问题一直是该工具的很高成本，其年度高昂的维护成本以及对经过良好训练，专门的技术人员进行操作的需求。 现在，通过该技术人员的资助建立了合作伙伴关系，现在将规避这些问题，导致成本低于当前的商业可用性。 据估计，当该计划完全运行时，可以达到约100美元/箔的价格。