Impurity and self-diffusion related to the copper sublattice in CIGSe thin-film solar cells

CIGSe薄膜太阳能电池中与铜子晶格相关的杂质和自扩散

• 批准号: 172233413
• 负责人: Professor Dr. Nicolaas A. Stolwijk (†)
• 金额: --
• 依托单位: Institut für Materialphysik
• 依托单位国家: 德国
• 项目类别: Research Grants
• 财政年份: 2010
• 资助国家: 德国
• 起止时间: 2009-12-31 至 2016-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/172233413?language=en
• 关键词: Impurity; self; diffusion; related; copper

The proposal aims at the comprehensive characterization of diffusion processes in Cu(In,Ga)Se2 (CIGSe) layers, in order to provide a scientific basis for the further optimization of the corresponding thin-film solar cells. The scheduled investigations concern both Cu self-diffusion and the diffusion and solubility of the impurity elements Ag and Na, which are likely to be accommodated by the Cu sublattice and are of great importance for CIGSe technology. In particular, it is planned to elucidate - by elaborate experiments in poly- and monocrystalline CI(G)Se layers - the anomalous diffusion behaviour of Ag and Na that was observed during the first period of the project. Comparing the properties of impurity diffusion with those of self-diffusion should make it feasible to detect the lattice defects involved, such as, e.g., vacancies and grain boundaries, and to identify the diffusion mechanism in each case. The main experimental method is radiotracer diffusion profiling, which will be supplemented by mass-spectroscopic measurements using SIMS analysis. Additional data on solubility and segregation will be obtained by examinations on a near-atomic scale using atom-probe analysis.

本课题旨在全面表征Cu(in,Ga)Se2 （CIGSe）层中的扩散过程，为进一步优化相应的薄膜太阳能电池提供科学依据。计划进行的研究涉及Cu的自扩散和杂质元素Ag和Na的扩散和溶解度，这些元素可能被Cu亚晶格容纳，对CIGSe技术具有重要意义。特别是，计划通过在多晶和单晶CI(G)Se层中进行的详细实验来阐明在项目的第一阶段观察到的Ag和Na的异常扩散行为。通过比较杂质扩散和自扩散的性质，可以检测到所涉及的晶格缺陷，例如空位和晶界，并确定每种情况下的扩散机制。主要的实验方法是放射性示踪剂扩散谱，将辅以质谱测量使用SIMS分析。关于溶解度和偏析的其他数据将通过使用原子探针分析在近原子尺度上的检查获得。

项目成果

Impact of surface roughness on tracer depth profiling and its implications for Cd109 and Zn65 diffusion experiments in solar-grade Cu(In,Ga)Se2 layers

表面粗糙度对示踪剂深度分析的影响及其对太阳能级 Cu(In,Ga)Se2 层中 Cd109 和 Zn65 扩散实验的影响

• DOI: 10.1016/j.apsusc.2014.04.050
• 发表时间: 2014
• 期刊: Applied Surface Science
• 影响因子: 6.7
• 作者: T. Eschen;K. Hiepko;J. Bastek;N.A. Stolwijk
• 通讯作者: N.A. Stolwijk

Radiotracer diffusion of Ag in Cu(In,Ga)Se 2 thin films

Ag 在 Cu(In,Ga)Se 2 薄膜中的放射性示踪扩散

• DOI: 10.1016/j.tsf.2016.09.045
• 发表时间: 2017
• 期刊: Thin Solid Films
• 影响因子: 2.1
• 作者: M. Wegner;F. Wilangowski;R. Wuerz;N.A. Stolwijk
• 通讯作者: N.A. Stolwijk