GOALI: An Integrated Submillimeter-Wave Scattering Parameter Measurement System Based on the Six-Porter Reflectometer

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The objective of this proposal is to initiate a joint research effort teaming the University ofVirginia and Virginia Diodes, Inc. to develop a robust measurement infrastructure for thesubmillimeter region of the electromagnetic spectrum. This work will address major difficultiesand challenges that are associated with measuring and characterizing systems and devices atsubmillimeter-wave frequencies. The two primary research activities to be undertaken duringthis project are: (1) the design and prototyping of six-port ref;ectometer architectures suitablefor measurements at submillimeter wavelengths and (2) the development of integrated diode-based sensors. These objects are aimed at producing integrated diode-based instrumentscapable of measuring scattering parameters in the 295{320 GHz and 575{640 GHz frequencybands(1) The intellectual merit of this project lies in its potential to signicantlyexpand and improve present-day measurement capabilities in the terahertzportion of the spectrum. The terahertz region of the spectrum remainslargely unexplored and the scarcity of reliable and robust instrumentationremains a major obstacle to the full use and scientific investigation of thisspectral region.(2) The broad impact of this proposed work will be felt not only by the engi-neers focusing on developing high-frequency circuits and devices, but by awide variety of scientists working in many different areas of fundamentalresearch. Successful development of the instrument proposed here wouldhave a direct and signicant impact on radio astronomy, atmospheric re-mote sensing, molecular spectroscopy, and biological sensing fields thatrely critically upon the availability of submillimeter components, devices,and instruments.The program will team researchers from the University of Virginia and engineers at VirginiaDiodes, Inc. focusing on the investigation, design, and prototyping of fully integrated sensorarrays for measuring submillimeter scattering parameters using six-port reflectometer archi-tectures. The project will culminate with the fabrication and demonstration of compact,integrated instruments operating in the 295{320 GHz and 575{640 GHz spectral regions, fre-quency bands that are important for a number of ongoing scientific research initiatives inastronomy, spectral sensing, and imaging.A-1