Non-Contacting Sampled - Line Reflectometers for In-Situ Measurement of Microwave and Millimeter-Wave Circuit Modules
Non-Contacting Sampled - Line Reflectometers for In-Situ Measurement of Microwave and Millimeter-Wave Circuit Modules
批准号:
0300086
负责人:
Robert Weikle
金额:
$19.71万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2003
资助国家:
美国
项目状态:
已结题
起止时间:
2003-05-01 至 2007-04-30
中文摘要
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英文摘要
0300086WeikleThe objective of this project is to investigate and develop a new approach for the non-invasive measurement and characterization of integrated microwave and millimeter-wave circuit modules. This work, in particular, aims to address present-day difficulties and challenges associated with measuring and characterizing high-frequency subsystems that are integrated with other components on a single circuit board or chip. The ultimate goal of this program is the development of a non-contacting network analyzer for the direct, in-situ measurement of scattering parameters of integrated or on-chip microwave and millimeter-wave subsystems.The research activities to be undertaken during this project will include the refinement and application of device and IC processing technologies to the development of fully-integrated network analyzer sampling circuits, the establishment of calibration standards and procedures for non-contacting measurement schemes, and the investigation, design, and demonstration of non-contacting reflectometers for s-parameter measurements. These activities will directly address and impact the merit review criteria set forth by the National Science Foundation:(1)The intellectual merit of this project lies in its potential to significantly expandand improve the measurement and diagnostic capabilities currently employedfor high-frequency integrated circuits. This will not only benefit the microwavemeasurements community but will significantly impact all fields that rely onmillimeter and submillimeter-wave instrumentation.(2)The broad impact of this proposed work will be felt by researchers working onhigh-frequency integrated systems as well as students, researchers, and facultyat the University of Virginia and other institutions. The instrumentation de-veloped through this program will enhance and complement the capabilities ofthe PI's research and teaching laboratories while the close involvement and partici-pation of graduate and undergraduate students will be crucial to supporting theeducational mission of the university and provide an avenue for incorporatingthis work into the existing curriculum. In addition, through current collabora-tive work with other institutions, the technical achievements developed from thisprogram will be shared and disseminated directly to the communities that relyon millimeter and submillimeter-wave systems.The program will culminate with the demonstration of a fully-integrated non-contactings-parameter measurement system operating in the millimeter-wave range and scalable to frequencies reaching into the submillimeter spectrum
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