Scanning Probe Microscopy of Nano-Electronic Structures

本项目应用低温扫描探针法来解析半导体和金属中纳米电子系统的量子结构。在半导体工作方面，该项目将应用地下电荷积累，这是一种能够分解地下系统中单个电子的专门技术。这项技术将被用于探测硅中纳米碎裂的施主原子对的电子加成光谱。这些物体可以被认为是供体分子，类似于自由空间中的类氢分子。目标是对这些微小半导体系统的量子力学进行基本测试。关于金属系统，这个项目将应用扫描隧道显微镜来测量碲化铈的局域态密度，这是一种层状晶体，含有表现出近藤行为的铈原子。因此，本研究将直接探索近藤晶格系统。扫描探针显微镜研究已被证明是年轻物理学家的杰出训练场。此外，将与密歇根州立大学科学剧院一起表演并反复改进一场教育纳米科学表演。非技术摘要随着集成电路继续迅速缩小规模，了解半导体和被单个杂质原子捕获并与之相互作用的金属中电子的性质变得越来越重要。先进的显微技术已经并可能继续在开发纳米电子器件方面发挥关键作用。这项研究应用了两种技术：亚表面电荷积累成像和低温扫描隧道显微镜。将进行两个项目。其中一个项目将探测和测试一个真正的原子规模的设备，该设备只由两个精心放置在硅中的杂质原子组成。第二个项目将解决碲化铈中导电电子的性质。在这种金属中，磁性Ce原子的存在有望赋予导电电荷惊人的性质。这项研究将为研究生和本科生提供一个具有挑战性的培训场地，因为他们掌握了先进的显微镜和样品制作技术。此外，还将与密歇根州立大学科学剧院联合演出一场教育纳米科学表演。这场展览将为4-12年级的学生带来纳米技术的实际介绍。

TECHNICAL ABSTRACTThis project applies cryogenic scanning probe methods to resolve the quantum structure of nanoelectronic systems in semiconductors and metals. With regard to the semiconductor work, this project will apply subsurface charge accumulation, a specialized technique capable of resolving individual electrons in subsurface systems. The technique will be applied to probe the electron addition spectra of nanofabricated pairs of donor atoms in silicon. These objects can be considered as donor molecules, analogous to hydrogenic molecules in free space. The goal is to perform fundamental tests of the quantum mechanics of these minuscule semiconductor systems. With regard to metallic systems, this project will apply scanning tunneling microscopy to measure the local density of state of cerium-telluride, a layered crystal that contains cerium atoms that exhibit Kondo behavior. Hence this study will directly probe a Kondo lattice system. Scanning probe microscopy research has proven to be an outstanding training ground for young physicists. Moreover, an educational Nanoscience show will be performed and iteratively improved, in conjunction with the Michigan State University Science Theatre. NON-TECHNICAL ABSTRACTAs integrated circuits continue to rapidly scale down in size, understanding the nature of electrons in semiconductors and metals trapped by and interacting with individual impurity atoms has become increasingly essential. Advanced microscopic techniques have played and will likely continue to play a key role in developing nanoelectronic devices. This research applies two such techniques: Subsurface Charge Accumulation imaging, and low-temperature Scanning Tunneling Microscopy. Two projects will be conducted. One project will probe and test a true atomic-scale device, composed of only two impurity atoms carefully positioned in silicon. The second project will resolve the properties of conducting electrons in cerium-telluride. In this metal the presence of the magnetic cerium atoms is expected to give surprising properties to the conducting charge. This research will provide a challenging training ground for graduate and undergraduate students, as they master advanced microscopy and sample fabrication techniques. Moreover, an educational Nanoscience show will be performed in conjunction with the Michigan State University Science Theatre. This show will literally bring a hands-on introduction to nanotechnology for students in grades 4-12.