MRI-R2: Acquisition of a Field-Emission Scanning Electron Microscope

0960195 johnsonu。技术摘要：该奖项是根据2009年美国复苏和再投资法案（公法111-5）资助的。该提案是为了在OU获得一台场发射扫描电子显微镜（FE-SEM），用于成像，分析工作和电子束光刻（EBL）。从本质上讲，这些工具是纳米科学研究所需的“眼睛”和“笔”。这款现代FE-SEM的特点包括：(1)低加速电压，即使低于1 kV，也能对导体、绝缘体甚至生物材料提供出色的分辨率；(2)更大的样品室，可以让我们在没有额外准备的情况下观察更大的样品，并允许“一套技术”，提供真正的纳米级地形、结构和成分对比，以及元素和晶体表征。在FE-SEM上的电子束光刻将为我们提供线宽低于10纳米的写入能力。获得一台FE-SEM将为开放大学的工程和科学项目提供巨大的智力价值。该提案的智力价值的具体例子包括：加快半导体结构作为电子、光子和自旋电子器件应用的创新材料的研究工作；推进新型靶向给药纳米颗粒的开发；了解支架结构在各种组织工程材料中对细胞生长和细胞整合的作用；扩大我们对聚合物和单壁碳纳米管之间相互作用的认识。FE-SEM的收购也将把纳米科学推广到整个州的下一个水平。这一提议的更广泛影响的具体例子包括：加强开放大学作为纳米技术在工业界和学术界的区域中心的努力；远程或网络存在将加强我们已经强大的电子显微镜推广工作；现有的与高中、社区学院和地区四年制大学的推广工作将产生广泛的影响。概要：本奖项是根据2009年美国复苏和再投资法案（公法111-5）资助的。俄克拉荷马大学获得了最先进的场发射扫描电子显微镜（FE-SEM），这将使研究人员能够进入纳米世界，使导体、绝缘体、纳米电子和生物材料的成像变得容易和通用。真正的纳米尺度的地形、结构和组成图像和信息需要这项技术把我们的纳米技术带到接近原子的水平。一个大的样品室将允许更大的样品完整地被检查，用最少的准备，允许一套分析技术提供纳米化学信息制造不同的材料。FE-SEM上的电子束光刻（EBL）能力将允许以尽可能细的宽度将纳米级图案写入材料上。这些能力将为我们提供在纳米尺度上探测、相互作用和操纵它们的特性的手段。收购一台FE-SEM将对俄勒冈大学已经是一流的工程和科学项目产生巨大的智力影响。具体而言，该提案将允许加速对半导体结构的研究工作，包括用于电子，磁性，发光和传感设备的创新材料；将推动新型纳米颗粒靶向给药技术的发展；将详细了解支架结构在各种组织工程材料中细胞生长和细胞整合中的作用。合成骨和器官合成)；扩展我们对聚合物和单壁碳纳米管之间相互作用的知识，以实现导电和高强度聚合物复合材料的最终目标。通过加强俄勒冈州立大学在工业和学术界作为纳米技术区域中心的努力，FE-SEM的收购也将把纳米科学推广到整个州的下一个水平。此外，FE-SEM将通过提供现场演示（例如演示和参观）或远程演示或网络呈现的方式，加强我们与K-12学校，社区学院和地区四年制大学已经强大的电子显微镜推广工作，电子显微镜在几乎所有科学领域都发挥着至关重要的作用。

0960195JohnsonU. of Oklahoma Norman CampusTechnical Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). This proposal is for the acquisition of a Field-Emission Scanning Electron Microscope (FE-SEM) at OU for imaging, analytical work, and electron beam lithography (EBL). Essentially these tools are the "eyes" and "pen" required for doing nanoscience. Features of this modern FE-SEM include: (1) low acceleration voltage which provides excellent resolution even below 1 kV on conductors, insulators and even biological materials and (2) a bigger sample chamber that will allow us look at larger samples without additional preparation and will permit a "suite of techniques" that will provide truly nanoscale topographic, structural, and compositional contrast along with elemental and crystalline characterization. Electron beam lithography on the FE-SEM will provide us with writing capabilities below 10 nm linewidths.The acquisition of a FE-SEM will provide enormous intellectual merit to the engineering and science programs at OU. Specific examples of the intellectual merit of this proposal include: Accelerate research efforts on semiconductor-based structures as innovative materials for electronic, photonic, and spintronic device applications; Advance the development of novel nanoparticles for targeted drug delivery; Provide an understanding of the role of scaffold structure on cell growth and cell integration in a variety of tissue engineered materials; and Expand our knowledge of the interactions between polymers and single-walled carbon nanotubes.The acquisition of an FE-SEM will also take nanoscience outreach to the next level throughout the state. Specific examples of the broader impacts of this proposal include: Strengthen OU's efforts to act as a regional hub for nanotechnology in industry and academia; Tele or web-presence will enhance our already strong electron microscopy outreach effort; and Broad impact will be felt in existing outreach efforts with high schools, community colleges, and regional 4 year universities. Layman Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). The University of Oklahoma's acquisition of a state-of-the-art Field-Emission Scanning Electron Microscope (FE-SEM) will allow researchers access to the nanoworld, allowing easy and versatile imaging of conductors, insulators, nanoelectronic and biological materials. Truly nanoscale topographic, structural, and compositional images and information require this technology to take our nanotechnology to the near-atomic level. A large sample chamber will allow larger samples to be examined intact, with minimal preparation, permitting a suite of analytical techniques to provide nanochemically-informed fabrication of diverse materials. Electron Beam Lithography (EBL) capacities on the FE-SEM will allow nanoscopic patterns to be written onto materials at the finest widths possible. These capabilities will provide us with the means to probe, interact, and manipulate their properties on the nanoscale.The acquisition of a FE-SEM will have an enormous intellectual impact on the already first rate engineering and science programs at OU. Specifically this proposal will allow an accelerations of research efforts on semiconductor-based structures including innovative materials for electronic, magnetic, and light emitting and sensing devices; will advance the development of novel nanoparticles for targeted drug delivery; will provide detailed understanding of the role of scaffold structure on cell growth and cell integration in a variety of tissue engineered materials(e.g. synthetic bone and organ synthesis); expand our knowledge of the interactions between polymers and single-walled carbon nanotubes for the ultimate goal of electrically conductive and high strength polymer composite materials.The acquisition of an FE-SEM will also take nanoscience outreach to the next level throughout the state by strengthening OU's efforts to act as a regional hub for nanotechnology in industry and academia. In addition, an FE-SEM will enhance our already strong electron microscopy outreach efforts with K-12 schools, community colleges, and regional 4-year universities by providing a means to demonstrate on site (e.g. demonstrations and tours) or remotely through tele or web-presence the vital role electron microscopy has in virtually all fields of scientific endeavor.