MRI: Acquisition of an analytical imaging X-Ray photoelectron spectrometer

MRI：购买分析成像 X 射线光电子能谱仪

• 批准号: 1228889
• 负责人: Alexander Shestopalov
• 金额: $ 56万
• 依托单位: University of Rochester
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2012
• 资助国家: 美国
• 起止时间: 2012-09-01 至 2014-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1228889&HistoricalAwards=false
• 关键词: MRI; Acquisition; analytical; imaging; Ray

This award to the University of Rochester is for the acquisition of a high resolution imaging X-ray Photoelectron Spectrometer (XPS). It will provide researchers with: (1) a highly sensitive quantitative tool to measure elemental composition, and chemical and electronic states of diverse inorganic and organic thin films and solids: and, (2) provide an imaging capability of chemical patterns and structured films with sub 3 nm lateral resolution. It will offer highly accurate and non-destructive characterization of inorganic semiconductors and insulators, organic and polymeric thin films, bio-inorganic interfaces, organic self-assembled monolayers, multilayered thin film devices and air/moisture sensitive samples. The XPS instrument will enable such multidisciplinary research projects as: (1) investigation of thermodynamic parameters of immobilized ligand-substrate pairs; (2) XPS and Ultraviolet Photoemission Spectroscopy (UPS) study of the model organic photovoltaic interfaces; (3) surface characterization of semiconductor quantum dots; and, (4) science and preservation of Daguerreotypes.Shared access to the instrument will be based on the successful model currently employed by the University of Rochester's Nano facility, and it will find immediate use by researchers in the departments of Chemical, Mechanical, and Biomedical Engineering, Chemistry, Optics, Physics, Computer Science, Materials Science, and the Medical Center. The shared XPS facility will also facilitate collaborations between Rochester University and surrounding academic institutions and industries. One of the critical parameters of the new instrument is fully automatic operation, which can analyze multiple samples. This will permit the 24/7 use of the instrument and will facilitate analysis of samples from research institutions outside of the greater Rochester area. The instrument will significantly impact the University's undergraduate and graduate research programs. Three courses will be modified to help students interested in Engineering, Physics, and Materials Science learn about advanced characterization technique and give them a hand-on experience with XPS and other analytical and imaging tools.

授予罗切斯特大学的这一奖项是为了获得高分辨率成像X射线光电子能谱仪（XPS）。 它将为研究人员提供：（1）一种高灵敏度的定量工具，用于测量各种无机和有机薄膜和固体的元素组成以及化学和电子状态;（2）提供化学图案和结构化薄膜的成像能力，横向分辨率低于3 nm。 它将为无机半导体和绝缘体、有机和聚合物薄膜、生物无机界面、有机自组装单层、多层薄膜器件和空气/湿度敏感样品提供高度准确和非破坏性的表征。 XPS仪器将使多学科研究项目成为可能：（1）固定化配体-底物对的热力学参数研究;（2）XPS和紫外光电子能谱（UPS）研究模型有机光伏界面;（3）半导体量子点的表面表征;以及（4）达盖尔照相的科学和保存。共享该仪器将基于罗切斯特大学纳米设施目前采用的成功模式，它将立即被化学、机械和生物医学工程、化学、光学、物理、计算机科学、材料科学和医学中心的研究人员使用。共享的XPS设施还将促进罗切斯特大学与周边学术机构和行业之间的合作。 新仪器的关键参数之一是全自动操作，可以分析多个样品。 这将允许24/7使用该仪器，并将有助于分析来自大罗切斯特地区以外的研究机构的样本。该仪器将显着影响大学的本科生和研究生的研究计划。将修改三门课程，以帮助对工程，物理和材料科学感兴趣的学生了解先进的表征技术，并为他们提供XPS和其他分析和成像工具的实践经验。