Aberration-Corrected High-Resolution and in situ Transmission Electron Microscopy of Carbon Allotropes and Related Device Structures (Z02)

在这一中心项目中，将使用经过像差校正的高分辨率分析电子显微镜，结合先进的FIB/SEM技术，与SFB的其他项目密切合作，对碳同素异构体、碳同素异构体结构、杂化纳米复合材料和薄膜以及相关器件结构进行详细的原子尺度研究。此外，在第二个资助期开发的创新的原位电子显微镜/扫描电子显微镜技术将用于研究(几层)石墨烯的晶体缺陷和表面功能化的形成和动力学，以及有机太阳能电池中杂化纳米复合材料的结构演变。

Within this central project aberration-corrected high-resolution and analytical TEM in tandem with advanced FIB/SEM techniques will be employed for detailed atomic-scale investigations of carbon allotropes, carbon allotrope architectures, hybrid nanocomposites and thins films as well as related device structures, in close collaboration with the other projects of the SFB. Moreover, innovative in situ TEM/SEM techniques developed in the second funding period will be employed for studying the formation and dynamics of crystal defects and of surface functionalization of (few-layer) graphene, as well as the structural evolution of hybrid nano-composites in organic solar cells.