Aberration-Corrected High-Resolution and in situ Transmission Electron Microscopy of Carbon Allotropes and Related Device Structures (Z02)

碳同素异形体及相关器件结构的像差校正高分辨率原位透射电子显微镜 (Z02)

• 批准号: 209745663
• 金额: --
• 依托单位: Lehrstuhl für Mikro- und Nanostrukturforschung
• 依托单位国家: 德国
• 项目类别: Collaborative Research Centres
• 财政年份: 2012
• 资助国家: 德国
• 起止时间: 2011-12-31 至 2022-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/209745663?language=en
• 关键词: Aberration; Corrected; Resolution; situ; Transmission

Within this central project aberration-corrected high-resolution and analytical TEM in tandem with advanced FIB/SEM techniques will be employed for detailed atomic-scale investigations of carbon allotropes, carbon allotrope architectures, hybrid nanocomposites and thins films as well as related device structures, in close collaboration with the other projects of the SFB. Moreover, innovative in situ TEM/SEM techniques developed in the second funding period will be employed for studying the formation and dynamics of crystal defects and of surface functionalization of (few-layer) graphene, as well as the structural evolution of hybrid nano-composites in organic solar cells.

在这个中心项目中，像差校正高分辨率和分析型 TEM 与先进的 FIB/SEM 技术相结合，将与 SFB 的其他项目密切合作，对碳同素异形体、碳同素异形体结构、混合纳米复合材料和薄膜以及相关器件结构进行详细的原子尺度研究。此外，第二期资助期间开发的创新原位 TEM/SEM 技术将用于研究晶体缺陷和（几层）石墨烯表面功能化的形成和动态，以及有机太阳能电池中混合纳米复合材料的结构演化。