Aberration-Corrected High-Resolution and in situ Transmission Electron Microscopy of Carbon Allotropes and Related Device Structures (Z02)

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Within this central project aberration-corrected high-resolution and analytical TEM in tandem with advanced FIB/SEM techniques will be employed for detailed atomic-scale investigations of carbon allotropes, carbon allotrope architectures, hybrid nanocomposites and thins films as well as related device structures, in close collaboration with the other projects of the SFB. Moreover, innovative in situ TEM/SEM techniques developed in the second funding period will be employed for studying the formation and dynamics of crystal defects and of surface functionalization of (few-layer) graphene, as well as the structural evolution of hybrid nano-composites in organic solar cells.