Microwave Impedance Microscopy Study of Topological Structures of Quantum Materials

量子材料拓扑结构的微波阻抗显微镜研究

• 批准号: 1305731
• 负责人: Zhi-Xun Shen
• 金额: $ 56万
• 依托单位: Stanford University
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2013
• 资助国家: 美国
• 起止时间: 2013-06-01 至 2019-05-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1305731&HistoricalAwards=false
• 关键词: Microwave; Impedance; Microscopy; Study; Topological

****Technical Abstract****The goal of this program is to study local structures of quantum materials with electrical contrast. Because of its scientific as well as technological importance, the electronic properties of complex quantum materials have been an important area of research. As model material systems, their understanding often leads to revelations well beyond these materials themselves, as well as to important technology. A recent development of the field is the emerging importance of local organizations in these materials, such as edge channels, domain walls, glassy patterns and interface structures. As a result, it is highly desirable to probe the local electrical response to external excitations and gain insight on electronic organization in these materials. The experimental tool to carry out this study is a novel scanning near-field microwave impedance microscopy (sMIM). With optimized sensitivity, the minute local dielectric response to electromagnetic waves can be detected by RF electronics to form microwave images, with a spatial resolution determined by the tip diameter which can be one million times smaller than radiation wavelength. The combined strength of high resolution microwave imaging and temperature/field environment in the experimental system will allow the team to spatially visualize many interesting physical processes. This project will support the education of a PhD student and postdoc in these highly sophisticated experiments, which have historically been excellent training for many scientific careers from academia to the most advanced technology industries. ****Non-Technical Abstract****The goal of this program is to study electrical properties of materials that are candidates to continue the Si revolution. This understanding often leads to revelations well beyond these materials themselves, as well as to important new technology. A recent development of the field is the emerging importance of local organizations in these materials. As a result, it is highly desirable to probe the local electrical response to external excitations and gain insight on electronic organization in these materials, thus optimizing the opportunity to tailor their properties for application. The experimental tool to carry out this study is a novel scanning near-field microwave impedance microscopy (sMIM). This project will support the education of a PhD student and postdoc in these highly sophisticated experiments, which have historically been excellent training for many scientific careers from academia to the most advanced technology industries. Because of the relative ease of operation of RF electronics, a first-order understanding of the technique and its contrast mechanism are easily understood with a simple lumped-element circuit models, which can be taught in high school physics classes. Further, the dual nature of both science and instrumentation development is an excellent platform to engage college students for research. This technology is also of industrial interest, for example in semiconductor metrology.

*技术摘要*这个项目的目标是研究具有电学对比的量子材料的局域结构。由于其在科学和技术上的重要性，复杂量子材料的电子性质一直是一个重要的研究领域。作为模型材料系统，他们的理解往往会带来远远超出这些材料本身的启示，以及重要的技术。该领域的一个最新发展是，地方组织在这些材料方面的重要性正在显现，例如边缘通道、域壁、玻璃图案和界面结构。因此，探索材料对外界激励的局域电学响应，了解这些材料中的电子结构是非常必要的。进行这项研究的实验工具是一种新型的扫描近场微波阻抗显微镜(SMIM)。在优化的灵敏度下，射频电子学可以探测到电磁波的微小局部介电响应，形成微波图像，空间分辨率由尖端直径决定，可以比辐射波长小一百万倍。高分辨率微波成像和实验系统中的温度/场环境的结合强度将使团队能够在空间上可视化许多有趣的物理过程。该项目将支持在这些高度复杂的实验中培养博士生和博士后，这些实验在历史上一直是从学术界到最先进的技术行业的许多科学职业的极佳培训。*非技术摘要*本计划的目标是研究有望继续硅革命的材料的电学性质。这种理解往往会带来远远超出这些材料本身的启示，以及重要的新技术。该领域的一个最新发展是，地方组织在这些材料中的重要性正在显现。因此，探测材料对外界激励的局部电学响应，洞察这些材料中的电子结构，从而优化其应用性能的机会是非常必要的。进行这项研究的实验工具是一种新型的扫描近场微波阻抗显微镜(SMIM)。该项目将支持在这些高度复杂的实验中培养博士生和博士后，这些实验在历史上一直是从学术界到最先进的技术行业的许多科学职业的极佳培训。由于射频电子学的操作相对容易，通过简单的集总元件电路模型就可以很容易地理解该技术及其对比机制的一阶理解，这些模型可以在高中物理课堂上教授。此外，科学和仪器开发的双重性质是吸引大学生进行研究的一个极好的平台。这项技术也具有工业意义，例如在半导体计量学中。