Understanding the Migration Fates of Contaminants at Water/sediment Interface after Environmental Shocks Using Innovative Real-time in situ Profiling

使用创新的实时原位分析了解环境冲击后水/沉积物界面污染物的迁移命运

• 批准号: 1336425
• 负责人: Baikun Li
• 金额: $ 30万
• 依托单位: University of Connecticut
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2013
• 资助国家: 美国
• 起止时间: 2013-09-01 至 2017-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1336425&HistoricalAwards=false
• 关键词: Understanding; Migration; Fates; Contaminants; Water

CBET 1336425Baikun LiUniversity of ConnecticutThe study aims at developing a new generation microelectrode (ME) with easy fabrication, sturdy structure, simple setup and capability of simultaneously measuring multiple parameters at multiple points to profile the spatial distribution of contaminants, thus providing useful information to elucidate their fate. All-in-one microelectrode chips (AIO MECs) provide real-time, continuous, and accurate monitoring of physical-chemical variation following system shocks. With the water/sediment interface as the target, four tasks will be conducted. First, as the precursor of the AIO MECs, one-dimension MECs (1D MECs) will be fabricated using photolithography to produce sturdy MEs on silicon chips. The position of each ME will be known so that the 1D MECs are capable of profiling along the depth of samples without the need of micromanipulators. Second, AIO MECs will be developed by patterning multiple 1D MECs onto a single chip, so that one chip can simultaneously measure multiple parameters at multiple points. Third, the applicability of 1D MECs and AIO MECs will be examined under two shocks (concentration- and flow rate-dependent shocks) in lab-scale tests and lake sediments. Finally, the short-term (days) and long-term (months) impacts of shocks at the water/sediment interface will be monitored in real-time mode. The MEC profiles will be integrated with models to elucidate the migration fates of contaminants, which will provide timely restoration protocols for site cleanup before irreversible deterioration of the natural environment. This proof-of-concept work will provide real-time monitoring of physical-chemical variations (e.g., nitrogen, phosphorous, redox potential, and proton) after shocks, and allow fundamental understanding of the dynamic transport of contaminants. By developing the new generation ME technology to achieve real-time monitoring of contaminants after shocks, the proposed research will impact protection and restoration of vital ecosystems, maintaining environmental sustainability for future generations. The AIO MECs will lead to compact and simple monitoring kits that will revolutionize real-time monitor of diverse systems including large-scale contaminated sites and harsh environment (deep sea sediment). Multiple outreach initiatives including workshops and high school seminars will promote the scientific/engineering competence of underrepresented groups. The research will strengthen an existing collaboration with water industries to achieve real-time in situ monitoring of natural and engineered systems. Finally, the new generation ME technology for profiling water qualities and contaminants will be a strong force to promote environmental engineering research and education in the State of Connecticut and New England area.

该研究旨在开发新一代微电极（ME），该微电极易于制造，结构坚固，设置简单，能够同时测量多点多个参数，以描绘污染物的空间分布，从而为阐明其命运提供有用的信息。一体化微电极芯片（AIO MECs）提供实时，连续，准确的监测系统冲击后的物理化学变化。以水/沉积物界面为目标，将进行四项任务。首先，作为AIO MECs的前身，一维MECs （1D MECs）将使用光刻技术在硅芯片上制造坚固的MECs。每个mec的位置都是已知的，这样1D mec就能够沿着样品的深度进行分析，而不需要微操纵器。其次，AIO mec将通过将多个1D mec图案化到单个芯片上来开发，这样一个芯片可以同时在多个点测量多个参数。第三，1D mec和AIO mec的适用性将在实验室规模试验和湖泊沉积物的两种冲击（浓度和流速相关的冲击）下进行检验。最后，将实时监测冲击对水/沉积物界面的短期（天）和长期（月）影响。MEC剖面将与模型相结合，阐明污染物的迁移命运，这将在自然环境不可逆转恶化之前为现场清理提供及时的恢复方案。这项概念验证工作将提供冲击后物理化学变化（如氮、磷、氧化还原电位和质子）的实时监测，并允许对污染物的动态传输有基本的了解。通过开发新一代ME技术，实现冲击后污染物的实时监测，拟议的研究将影响重要生态系统的保护和恢复，为子孙后代维护环境的可持续性。AIO mec将带来紧凑和简单的监测套件，将彻底改变各种系统的实时监测，包括大规模污染场地和恶劣环境（深海沉积物）。包括讲习班和高中研讨会在内的多项外联倡议将促进代表性不足群体的科学/工程能力。这项研究将加强与水工业的现有合作，以实现对自然和工程系统的实时现场监测。最后，用于分析水质和污染物的新一代ME技术将成为推动康涅狄格州和新英格兰地区环境工程研究和教育的强大力量。