MRI: Acquisition of a Combined X-ray Photoelectron Spectrometer and Scanning Auger Microprobe

MRI：获取组合 X 射线光电子能谱仪和扫描俄歇微探针

• 批准号: 1338173
• 负责人: John Hemminger
• 金额: $ 55万
• 依托单位: University of California-Irvine
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2013
• 资助国家: 美国
• 起止时间: 2013-09-15 至 2016-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1338173&HistoricalAwards=false
• 关键词: MRI; Acquisition; Combined; ray; Photoelectron

With this award from the Chemistry Major Research Instrumentation (MRI) Program and co-funding from the Chemistry Research and Facilities (CRIF) Program, Professor John Hemminger from University of California Irvine and colleagues Regina Ragan, Matthew Law, Reginald Penner and Daniel Munn will acquire a combined X-ray photoelectron spectrometer (XPS) and scanning Auger microprobe (SAM). The proposal is aimed at enhancing research and education at all levels, especially in areas such as (a) XPS and Auger electron spectroscopy (AES) depth profiling, SAM, and UPS studies of solar cell absorbers and device stacks; (b) characterization of metal oxide and metal chalcogenide nanocrystals for photocatalysis; (c) ultraviolet photoelectron spectroscopy (UPS), XPS and AES depth profiling studies; (d) manganese dioxide nanowires for ultra-high capacity and rate capabilities for lithium cathodes; (e) correlating surface functionalization and transport properties of single-walled carbon nanotubes; and (f) dynamics of thermally-grown oxides in power generation and propulsion materials.X-ray photoelectron spectrometers are used for chemical analysis. The XPS technique quantitatively measures elemental composition, empirical formula, chemical state and electronic state of the elements in a given material. A sample is irradiated with a beam of monochromatic X-rays and the kinetic energies of the resulting photoelectrons are measured and related to specific elements. XPS often plays a crucial role in defining the system under study. The technique requires the use of ultra-high vacuum conditions. In Auger electron spectroscopy, energetic electrons emitted from an excited atom are analyzed to provide information on surfaces. The work to be carried out by these investigators represents a wide array of systems requiring surface characterization. The instrumentation will be used in research activities and also for research training and education of a large number of students from diverse backgrounds.

凭借化学专业研究仪器 (MRI) 计划的奖励以及化学研究和设施 (CRIF) 计划的共同资助，加州大学欧文分校的 John Hemminger 教授及其同事 Regina Ragan、Matthew Law、Reginald Penner 和 Daniel Munn 将获得一台组合式 X 射线光电子能谱仪 (XPS) 和扫描俄歇微探针 (SAM)。该提案旨在加强各级的研究和教育，特别是在以下领域：(a) 太阳能电池吸收器和设备堆栈的 XPS 和俄歇电子能谱 (AES) 深度分析、SAM 和 UPS 研究； (b) 用于光催化的金属氧化物和金属硫族化物纳米晶体的表征； (c) 紫外光电子能谱（UPS）、XPS 和 AES 深度剖析研究； (d) 用于锂阴极超高容量和倍率能力的二氧化锰纳米线； (e) 关联单壁碳纳米管的表面功能化和传输特性； (f) 发电和推进材料中热生长氧化物的动力学。X射线光电子能谱仪用于化学分析。 XPS 技术定量测量给定材料中元素的元素组成、经验式、化学态和电子态。用单色 X 射线束照射样品，测量所得光电子的动能并将其与特定元素相关联。 XPS 在定义所研究的系统方面通常起着至关重要的作用。该技术需要使用超高真空条件。在俄歇电子能谱中，分析从受激原子发射的高能电子以提供表面信息。 这些研究人员要开展的工作代表了需要表面表征的各种系统。该仪器将用于研究活动以及对来自不同背景的大量学生的研究培训和教育。