MRI: Acquisition of a Combined X-ray Photoelectron Spectrometer and Scanning Auger Microprobe

在化学专业研究仪器(MRI)计划的这一奖项和化学研究与设施(CRIF)计划的共同资助下，加州大学欧文分校的John Hemminger教授及其同事Regina Ragan、Matthew Law、Reginald Penner和Daniel Munn将获得一台组合式X射线光电子能谱仪(XPS)和扫描俄歇微探头(SAM)。该建议旨在加强各级的研究和教育，特别是在下列领域：(A)太阳能电池吸收体和器件堆栈的XPS和俄歇电子能谱(AES)深度剖析、SAM和UPS研究；(B)用于光催化的金属氧化物和金属硫化物纳米晶体的表征；(C)紫外光电子能谱(UPS)、XPS和AES深度剖析研究；(D)用于锂阴极的超高容量和速率能力的二氧化锰纳米线；(E)单壁碳纳米管的表面官能化和传输特性；以及(F)发电和推进材料中热生长氧化物的动力学。XPS技术定量测量给定材料中元素的元素组成、经验式、化学状态和电子状态。用单色X射线束照射样品，测量产生的光电子的动能，并将其与特定元素相关联。XPS通常在定义研究中的系统方面发挥关键作用。这项技术需要使用超高真空条件。在俄歇电子能谱中，从一个被激发的原子发出的高能电子被分析以提供表面信息。这些研究人员将要开展的工作代表了一系列需要表面表征的系统。该仪器将用于研究活动，也将用于对来自不同背景的大量学生进行研究、培训和教育。

With this award from the Chemistry Major Research Instrumentation (MRI) Program and co-funding from the Chemistry Research and Facilities (CRIF) Program, Professor John Hemminger from University of California Irvine and colleagues Regina Ragan, Matthew Law, Reginald Penner and Daniel Munn will acquire a combined X-ray photoelectron spectrometer (XPS) and scanning Auger microprobe (SAM). The proposal is aimed at enhancing research and education at all levels, especially in areas such as (a) XPS and Auger electron spectroscopy (AES) depth profiling, SAM, and UPS studies of solar cell absorbers and device stacks; (b) characterization of metal oxide and metal chalcogenide nanocrystals for photocatalysis; (c) ultraviolet photoelectron spectroscopy (UPS), XPS and AES depth profiling studies; (d) manganese dioxide nanowires for ultra-high capacity and rate capabilities for lithium cathodes; (e) correlating surface functionalization and transport properties of single-walled carbon nanotubes; and (f) dynamics of thermally-grown oxides in power generation and propulsion materials.X-ray photoelectron spectrometers are used for chemical analysis. The XPS technique quantitatively measures elemental composition, empirical formula, chemical state and electronic state of the elements in a given material. A sample is irradiated with a beam of monochromatic X-rays and the kinetic energies of the resulting photoelectrons are measured and related to specific elements. XPS often plays a crucial role in defining the system under study. The technique requires the use of ultra-high vacuum conditions. In Auger electron spectroscopy, energetic electrons emitted from an excited atom are analyzed to provide information on surfaces. The work to be carried out by these investigators represents a wide array of systems requiring surface characterization. The instrumentation will be used in research activities and also for research training and education of a large number of students from diverse backgrounds.