MRI: Acquisition of a Combined X-ray Photoelectron Spectrometer and Scanning Auger Microprobe

MRI：获取组合 X 射线光电子能谱仪和扫描俄歇微探针

• 批准号: 1338173
• 负责人: John Hemminger
• 金额: $ 55万
• 依托单位: University of California-Irvine
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2013
• 资助国家: 美国
• 起止时间: 2013-09-15 至 2016-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1338173&HistoricalAwards=false
• 关键词: MRI; Acquisition; Combined; ray; Photoelectron

With this award from the Chemistry Major Research Instrumentation (MRI) Program and co-funding from the Chemistry Research and Facilities (CRIF) Program, Professor John Hemminger from University of California Irvine and colleagues Regina Ragan, Matthew Law, Reginald Penner and Daniel Munn will acquire a combined X-ray photoelectron spectrometer (XPS) and scanning Auger microprobe (SAM). The proposal is aimed at enhancing research and education at all levels, especially in areas such as (a) XPS and Auger electron spectroscopy (AES) depth profiling, SAM, and UPS studies of solar cell absorbers and device stacks; (b) characterization of metal oxide and metal chalcogenide nanocrystals for photocatalysis; (c) ultraviolet photoelectron spectroscopy (UPS), XPS and AES depth profiling studies; (d) manganese dioxide nanowires for ultra-high capacity and rate capabilities for lithium cathodes; (e) correlating surface functionalization and transport properties of single-walled carbon nanotubes; and (f) dynamics of thermally-grown oxides in power generation and propulsion materials.X-ray photoelectron spectrometers are used for chemical analysis. The XPS technique quantitatively measures elemental composition, empirical formula, chemical state and electronic state of the elements in a given material. A sample is irradiated with a beam of monochromatic X-rays and the kinetic energies of the resulting photoelectrons are measured and related to specific elements. XPS often plays a crucial role in defining the system under study. The technique requires the use of ultra-high vacuum conditions. In Auger electron spectroscopy, energetic electrons emitted from an excited atom are analyzed to provide information on surfaces. The work to be carried out by these investigators represents a wide array of systems requiring surface characterization. The instrumentation will be used in research activities and also for research training and education of a large number of students from diverse backgrounds.

有了化学主要研究仪器（MRI）计划的这一奖项和化学研究与设施（CRIF）计划的共同资助，来自加州尔湾大学的John Hemminger教授及其同事Regina Ragan，Matthew Law，Reginald Penner和丹尼尔Munn将获得一个组合的X射线光电子能谱仪（XPS）和扫描俄歇微探针（SAM）。该提案旨在加强各级的研究和教育，特别是在以下领域：（a）太阳能电池吸收器和器件叠层的XPS和俄歇电子能谱深度分布、SAM和UPS研究;（B）用于XPS的金属氧化物和金属硫属化物纳米晶体的特性;（c）紫外光电子能谱、XPS和俄歇电子能谱深度分布研究;（d）太阳能电池吸收器和器件叠层的XPS和俄歇电子能谱深度分布研究;（e）太阳能电池吸收器和器件叠层的XPS和俄歇电子能谱深度分布研究;（f）太阳能电池吸收器和器件叠（d）二氧化锰纳米线用于锂阴极的超高容量和倍率性能;（e）单壁碳纳米管的表面功能化和输运性质的关联;（f）发电和推进材料中热生长氧化物的动力学。XPS技术定量测量给定材料中元素的元素组成、经验式、化学状态和电子状态。用一束单色X射线照射样品，测量产生的光电子的动能，并将其与特定元素联系起来。XPS通常在定义所研究的系统方面起着至关重要的作用。该技术需要使用超高真空条件。在俄歇电子能谱中，分析从激发原子发射的高能电子以提供表面信息。 这些研究人员将要开展的工作代表了一系列需要表面表征的系统。该仪器将用于研究活动，也用于研究培训和来自不同背景的大量学生的教育。