PFI-TT: Multi-Channel Probe System for Multi-Functional Atomic Force Microscopy

PFI-TT：用于多功能原子力显微镜的多通道探针系统

• 批准号: 1827545
• 负责人: Hanna Cho
• 金额: $ 20万
• 依托单位: Ohio State University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2018
• 资助国家: 美国
• 起止时间: 2018-08-01 至 2022-01-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1827545&HistoricalAwards=false
• 关键词: PFI; TT; Multi; Channel; Probe

The broader impact/commercial potential of this PFI project is to bring a paradigm change in the Atomic Force Microscopy (AFM) probe market from a single-channel to multi-channel probe. AFM is one of the most powerful tools to image and characterize materials with nanometer scale resolution, leading to the extensive development of nano-/bio- science and technology. While there has been a significant improvement in all other aspects of AFM components, the AFM probe design has not changed from a simple rectangular or triangular beam over the past 30+ years. The proposed AFM probe can extend its functionality from a single-channel to multi-channel probe such that it can be easily employed in various AFM schemes to characterize multi-physical properties beyond topography. Thus, AFM users can effortlessly implement the advanced multi-functional AFM schemes with minimal ambiguity, complications, and artifacts, by simply employing this new AFM probe. The proposed innovation will forward the market position of the US AFM industry and the industries that rely on AFM utilization. As an unmatched and versatile tool to uncover important fundamentals in many areas of science and technology, the advancement of AFM will lead to further scientific discoveries and new technologies.The proposed project aims to overcome the technical barriers related to manufacturability, reliability, and repeatability in order to accelerate commercialization. The prototype device used for performance demonstration was individually fabricated by modifying a commercially available AFM cantilever with a focused ion beam (FIB) based milling process and transfer-printing assembly technique. In order to transform the new AFM probe technology into a promising commercial reality, we need to address the important technical and commercial hurdles. Therefore, the main objectives of this proposal are (i) development of a batch manufacturing process for the new probe design, (ii) topology optimization of the probe design to guarantee the reliability and performance robustness over the wide range of operating parameters, (iii) demonstration of the functionality of the new probe design in customer settings beyond the PI's laboratory, and (iv) development of commercialization strategy and execution plans.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

这个PFI项目的更广泛的影响/商业潜力是使原子力显微镜(AFM)探头市场从单通道探头转变为多通道探头。原子力显微镜是以纳米级分辨率对材料进行成像和表征的最有力的工具之一，促进了纳米/生物科学和技术的广泛发展。虽然AFM组件的所有其他方面都有了显著的改进，但AFM探头的设计在过去30多年里并没有从简单的矩形或三角形光束改变。所提出的原子力显微镜探头可以将其功能从单通道扩展到多通道探头，从而可以很容易地在各种AFM方案中使用，以表征地形以外的多个物理性质。因此，AFM用户只需使用这种新的AFM探头，就可以轻松地实施先进的多功能AFM方案，并将模糊性、复杂性和伪影降至最低。拟议的创新将推动美国AFM行业和依赖AFM利用的行业的市场地位。作为揭示许多科学技术领域重要基础的无与伦比的通用工具，原子力显微镜的进步将带来更多的科学发现和新技术。拟议的项目旨在克服与可制造性、可靠性和重复性有关的技术障碍，以加速商业化。用于性能演示的原型装置是通过使用基于聚焦离子束(FIB)的研磨工艺和转移印刷组装技术来修改商用AFM悬臂梁而单独制造的。为了将新的原子力显微镜探测技术转化为有前景的商业现实，我们需要解决重要的技术和商业障碍。因此，这项建议的主要目标是(I)为新的探头设计开发批量制造流程，(Ii)探头设计的拓扑优化，以保证在广泛的操作参数范围内的可靠性和性能稳定性，(Iii)在PI的实验室之外的客户环境中展示新探头设计的功能，以及(Iv)开发商业化战略和执行计划。该奖项反映了NSF的法定使命，并通过使用基金会的智力优势和更广泛的影响审查标准进行评估，被认为值得支持。

项目成果

Piezoelectric Heterogeneity in Collagen Type I Fibrils Quantitatively Characterized by Piezoresponse Force Microscopy

• DOI: 10.1021/acsbiomaterials.0c01314
• 发表时间: 2020-12-01
• 期刊: ACS BIOMATERIALS SCIENCE & ENGINEERING
• 影响因子: 5.8
• 作者: Kwon, Jinha;Cho, Hanna
• 通讯作者: Cho, Hanna