MRI: Acquisition of a Hard X-ray PhotoElectron Spectroscopy (HAXPES) for the Institute for Materials Research (IMR) at Binghamton University (BU)

MRI：为宾厄姆顿大学 (BU) 材料研究所 (IMR) 购买硬 X 射线光电子能谱 (HAXPES)

• 批准号: 1919704
• 负责人: Louis Piper
• 金额: $ 123.2万
• 依托单位: SUNY at Binghamton
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2019
• 资助国家: 美国
• 起止时间: 2019-09-01 至 2022-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1919704&HistoricalAwards=false
• 关键词: MRI; Acquisition; Hard; ray; PhotoElectron

The chemical and electronic properties of a solid can be measured non-destructively by analyzing the velocity of escaping electrons ejected from the material excited by X-rays. For most commercial laboratory-based soft X-ray sources, the majority of escaping electrons come from the topmost layers of the material making it a sensitive probe of the surface chemistry. Although surfaces are extremely important for many applications in catalysts and electronic devices, the chemistry at the surface is often distinctly different from the bulk underneath. Employing harder X-rays increases the percentage of electrons escaping from deeper within the material, but such bulk studies have thus far been limited to dedicated National facilities. Recent advances in new high-performance hard X-ray sources and detectors enable comparable bulk-sensitive measurements within a university laboratory setting thereby presenting a cost-effective means of increasing access to this emerging technique. The increased non-destructive chemical depth-profiling enables new insight into how buried layers within real device architectures evolve during operation, such as transistors, solar cells and batteries. The new instrument is accessible for academic and industry users across the U.S.A. The project integrates the instrument into various existing recruitment and educational programs at Binghamton University for increasing STEM retention and developing the workforce in next-generation technologies for energy harvesting, storage and efficiency.This project provides a novel laboratory-based HArd X-ray Photoelectron Spectroscopy (HAXPES) system for non-destructive chemical analysis of real materials and devices at Binghamton University. HAXPES studies at Synchrotron facilities are capable of precise chemical and electronic measurements at previously inaccessible regions of real materials and devices. The laboratory-based HAXPES instrument consists of a novel monochromatic Ga K-edge liquid jet x-ray source (9.25 KeV) enabling core and valence band studies with sampling depths up to 60 nm. This instrument dramatically increases access to this technique beyond the handful of Synchrotron-based HAXPES systems currently operational worldwide. Working with Federally funded centers at Binghamton and partnering institutions across the U. S. A. (both academic and industrial) this project is developing in-situ and operando HAXPES capabilities for studying active layers and buried contacts within next-generation transistors and (photo-)electrochemical cells during their operation. The HAXPES instrument is housed in a dedicated user facility for access to wider scientific community. The HAXPES system is integrated into several educational and training programs at Binghamton, including an undergraduate course examining the aesthetics of archeological artifacts within the context of their chemical and physical properties.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

固体的化学和电子性质可以通过分析从X射线激发的材料中射出的逃逸电子的速度来非破坏性地测量。对于大多数商业实验室软X射线源，大多数逃逸电子来自材料的最顶层，使其成为表面化学的敏感探针。 虽然表面对于催化剂和电子设备中的许多应用非常重要，但表面的化学性质通常与下面的本体明显不同。 使用更硬的X射线增加了从材料内部更深处逃逸的电子的百分比，但迄今为止，这种批量研究仅限于专用的国家设施。新的高性能硬X射线源和探测器的最新进展，使大学实验室设置内可比的体积敏感的测量，从而提出了一个具有成本效益的手段，增加获得这一新兴技术。增加的非破坏性化学深度分析使人们能够对真实的器件架构（例如晶体管、太阳能电池和电池）在操作过程中的埋层如何演变有新的见解。该项目将该仪器整合到宾厄姆顿大学现有的各种招聘和教育计划中，以提高STEM保留率并培养下一代能源收集技术的劳动力，该项目提供了一种新的基于实验室的HArd X射线光电子能谱（HAXPES）系统，用于非对真实的材料和设备进行破坏性化学分析。 同步加速器设施的HAXPES研究能够在以前无法进入的真实的材料和设备区域进行精确的化学和电子测量。 基于实验室的HAXPES仪器由一种新型的单色Ga K边液体射流X射线源（9.25 KeV）组成，能够进行采样深度高达60 nm的核心和价带研究。 该仪器大大增加了对该技术的使用，超越了目前在世界范围内运行的少数基于同步加速器的HAXPES系统。 与联邦政府资助的宾厄姆顿中心和美国各地的合作机构合作。S. A. (both学术和工业）该项目正在开发现场和操作HAXPES能力，用于研究下一代晶体管和（光）电化学电池运行期间的有源层和掩埋接触。HAXPES仪器安装在一个专用用户设施中，以便更广泛的科学界使用。 HAXPES系统被整合到宾厄姆顿的几个教育和培训项目中，包括一个本科课程，在化学和物理性质的背景下研究考古文物的美学。该奖项反映了NSF的法定使命，并被认为是值得通过使用基金会的智力价值和更广泛的影响审查标准进行评估的支持。

项目成果

Laboratory-based Hard X-ray Photoelectron Spectroscopy for Fundamental and Industrial Research

用于基础和工业研究的实验室硬 X 射线光电子能谱

• DOI: 10.1380/vss.64.493
• 发表时间: 2021
• 期刊: Vacuum and Surface Science
• 作者: HASHIMOTO, Takahiro;AMANN, Peter;REGOUTZ, Anna;BARRETT, Nick;PIPER, Louis F.;HAMOUDA, Wassim;RENAULT, Olivier;LUNDWALL, Marcus;MACHIDA, Masatake
• 通讯作者: MACHIDA, Masatake

Surface Chemistry Dependence on Aluminum Doping in Ni-rich LiNi0.8Co0.2−yAlyO2 Cathodes

富镍 LiNi0.8Co0.2−yAlyO2 阴极中铝掺杂的表面化学依赖性

• DOI: 10.1038/s41598-019-53932-6
• 发表时间: 2019
• 期刊: Scientific Reports
• 影响因子: 4.6
• 作者: Lebens-Higgins, Zachary W.;Halat, David M.;Faenza, Nicholas V.;Wahila, Matthew J.;Mascheck, Manfred;Wiell, Tomas;Eriksson, Susanna K.;Palmgren, Paul;Rodriguez, Jose;Badway, Fadwa
• 通讯作者: Badway, Fadwa