Equipment: MRI: Track 1 Acquisition of a multi-modal x-ray diffraction and scattering instrument

设备： MRI：轨道 1 获取多模态 X 射线衍射和散射仪器

• 批准号: 2320163
• 负责人: Katharine Flores
• 金额: $ 71.96万
• 依托单位: Washington University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2023
• 资助国家: 美国
• 起止时间: 2023-09-01 至 2026-08-31
• 项目状态: 未结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=2320163&HistoricalAwards=false
• 关键词: Equipment; MRI; Track; Acquisition; multi

The ability to describe the structure of a material – from the arrangement of atoms to the roughness of a surface – is foundational to the field of materials science and engineering. Determining how material structure changes during use or due to interactions with the environment is critical to understanding and addressing challenges as diverse as climate change, clean and efficient energy production and utilization, and disease detection. X-ray diffraction and scattering (XRD/S) techniques are uniquely capable of probing a broad range of structural features. The X-ray analysis system acquired in this project can be easily reconfigured to perform several complementary measurements and identify critical structural features responsible for a material’s behavior and functionality. Examples of the research enabled by this XRD/S instrument include improving the performance of materials used in batteries and ultra-thin electronic devices; designing new environmentally friendly biopolymers; developing inexpensive sensors to detect viruses and antibodies; discovering new alloys for light-weight automobiles and aircraft; and identifying and mitigating environmental contaminants in the water and air. At least 25 research groups spanning 8 disciplines at 5 universities plan to employ the instrument in their research. Additionally, the instrument will be a vital resource for training the next generation of scientists and engineers in a diverse set of measurement techniques. The instrument will be used by undergraduate and graduate students in a hands-on materials characterization course sequence, as well as in technical skills workshops that will be open to internal and external users.The multi-modal XRD/S instrument will enable researchers to probe materials structure in the following ways:• X-ray diffraction (XRD): XRD provides phase identification, lattice parameters, and domain size.• Small- and wide-angle X-ray scattering (SAXS/WAXS): SAXS provides information on size, shape, ordering, and self-similarity of materials on the 1-100 nm length scale while WAXS (often simultaneously) provides phase identification and an assessment of crystallinity.• X-ray reflectometry (XRR): XRR evaluates roughness and film thickness on flat surfaces.• Grazing incidence X-ray diffraction (GI-XRD): GI-XRD is a surface-sensitive XRD measurement, enabling determination of thin film strain, disruption of surface crystallinity, and surface precipitates.These modes are enhanced by a unique microfocus X-ray source for precisely collimating the incident X-ray beam, which maximizes the beam intensity and significantly reduces data collection times relative to conventional sealed tube sources. Accessories include a high-resolution translation stage, a battery cell and potentiostat, and an atmosphere-controlled heating/cooling stage, which enable high-throughput, in situ, and operando observations of dynamic phenomena crucial to understanding and manipulating materials behavior. These capabilities will be brought to bear on a wide range of materials research problems, including energy conversion and storage, geological and environmental systems, bio-derived materials and other polymers, and accelerated materials discovery and design.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

描述材料结构的能力 - 从原子的排列到表面的粗糙度 - 是材料科学和工程领域的基础。确定材料结构在使用过程中的变化或与环境相互作用在理解和解决像气候变化一样，清洁有效的能源生产和利用以及疾病检测等潜水员的挑战至关重要。 X射线衍射和散射（XRD/S）技术独特地能够探测广泛的结构特征。该项目中获得的X射线分析系统可以轻松地重新配置以执行多个完整的测量，并确定负责材料行为和功能的关键结构特征。该XRD/S仪器启用的研究的示例包括改善电池和超薄电子设备中使用的材料的性能；设计新的环保生物聚合物；开发廉价的传感器来检测病毒和抗体；发现用于轻型汽车和飞机的新合金；并确定并减轻水和空气中的环境污染物。至少有25个研究小组跨越5所大学的8个学科，计划在其研究中使用该工具。此外，该仪器将是培训下一代科学家和工程师的重要资源。 The instrument will be used by Undergraduate and graduate students in a hands-on materials characterization course sequence, as well as in technical skills workshops that will be open to internal and external users.The multi-modal XRD/S instrument will enable researchers to probe materials structure in the following ways:• X-ray diffraction (XRD): XRD provides phase identification, lattice parameters, and domain size.• Small- and wide-angle X-ray scattering (SAXS/WAXS): SAXS provides information on size, shape, ordering, and self-similarity of materials on the 1-100 nm length scale while WAXS (often quite simply) provides phase identification and an assessment of crystallinity.• X-ray reflectometry (XRR): XRR evaluates roughness and film thickness on flat surfaces.• Grazing incident X-ray diffraction (GI-XRD): GI-XRD is表面敏感的XRD测量，能够确定薄膜应变，表面结晶度的破坏和表面精确度。这些模式通过独特的微型X射线源来增强，以精确碰撞入射X射线光束，从而最大程度地降低了光束强度，并显着减少了相对于常规密封管源的数据收集时间。配件包括高分辨率翻译阶段，电池电池和电静静态，以及一个大气控制的加热/冷却阶段，这使高通量能够原位，以及对理解和操纵材料行为的动态现象至关重要的手术观测。这些功能将被带到各种材料研究问题上，包括能源转换和存储，地质和环境系统，生物衍生的材料和其他聚合物，以及加速的材料发现和设计。这一奖项反映了NSF的法定任务，并通过使用该基金会的知识分子优点和广泛的影响来评估NSF的法定任务。