Focused ion beam microscope for trace element analysis and nanomachining

用于痕量元素分析和纳米加工的聚焦离子束显微镜

• 批准号: LE160100063
• 负责人: Prof Elena Pereloma
• 金额: $ 65.35万
• 依托单位: University of Wollongong
• 依托单位国家: 澳大利亚
• 项目类别: Linkage Infrastructure, Equipment and Facilities
• 财政年份: 2016
• 资助国家: 澳大利亚
• 起止时间: 2016-01-01 至 2016-12-31
• 项目状态: 已结题
• 来源: https://dataportal.arc.gov.au/RGS/Web/Grants/LE160100063
• 关键词: Focused; ion; beam; microscope; trace

Focused ion beam microscope for trace element analysis and nanomachining: This project aims to fill the critical gap in 3-D imaging and compositional characterisation of metals, functional materials, polymers, biomaterials, ceramics and minerals at micro- and nano-scales. Coupling of dual column focused ion beam microscopy with secondary ion mass spectroscopy analysis will is designed to overcome the long-standing limitation of light and trace element analysis in scanning electron microscopes. This facility would provide Australian researchers with a new capability of characterising light and trace elements using scanning electron microscopy. Along with the ability to characterise a diverse range of materials in 3-D, the new system would enable fabrication of functional nanoscale devices for nanotechnology, biomedical and energy applications.

用于微量元素分析和纳米加工的聚焦离子束显微镜： 该项目旨在填补金属、功能材料、聚合物、生物材料、陶瓷和矿物在微米和纳米尺度上的三维成像和成分表征的关键空白。将双柱聚焦离子束显微镜与二次离子质谱分析相结合，旨在克服扫描电子显微镜在光和微量元素分析方面的长期局限性。该设施将为澳大利亚研究人员提供一种利用扫描电子显微镜表征光和微量元素的新能力。沿着的能力，以三维的各种材料，新系统将使功能纳米器件的纳米技术，生物医学和能源应用的制造。