Focused ion beam microscope for trace element analysis and nanomachining

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Focused ion beam microscope for trace element analysis and nanomachining: This project aims to fill the critical gap in 3-D imaging and compositional characterisation of metals, functional materials, polymers, biomaterials, ceramics and minerals at micro- and nano-scales. Coupling of dual column focused ion beam microscopy with secondary ion mass spectroscopy analysis will is designed to overcome the long-standing limitation of light and trace element analysis in scanning electron microscopes. This facility would provide Australian researchers with a new capability of characterising light and trace elements using scanning electron microscopy. Along with the ability to characterise a diverse range of materials in 3-D, the new system would enable fabrication of functional nanoscale devices for nanotechnology, biomedical and energy applications.