Resonant X-ray Diffraction under optimized destructive interference for highly sensitive determination of phase-resolved site-selective atomic displacements in crystalline materials

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The project aims at the methodical enhancement of Resonant X-ray Diffraction towards highly sensitive, phase-resolved determination of atomic displacements within the ideal structure of a crystal. These deviations of atomic positions will be characterized both in low-dimensional systems and under external influences like temperature, mechanical stress as well as electric and magnetic fields. Tuning to maximal destructive interference by means of varying the incident X-ray photon energy attains the essential increase of sensitivity. The method will be verified for selected ternary and quaternary oxides, which are in prime focus of current research. Theoretical first-principle modelling will support the interpretation of the experimentally determined deviations and ensure physio-chemical conclusiveness. An experimental characterization method with extreme accuracy in terms of phase-resolved atomic displacements in crystalline structures is expected from this project.