Resonant X-ray Diffraction under optimized destructive interference for highly sensitive determination of phase-resolved site-selective atomic displacements in crystalline materials

优化相消干涉下的共振 X 射线衍射，用于高灵敏度测定晶体材料中相分辨位点选择性原子位移

• 批准号: 324641898
• 负责人: Professor Dr. Dirk Carl Meyer
• 金额: --
• 依托单位: Hochschule für Technik und Wirtschaft Dresden (HTW)
• 依托单位国家: 德国
• 项目类别: Research Grants
• 财政年份: 2016
• 资助国家: 德国
• 起止时间: 2015-12-31 至 2019-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/324641898?language=en
• 关键词: Resonant; ray; Diffraction; under; optimized

The project aims at the methodical enhancement of Resonant X-ray Diffraction towards highly sensitive, phase-resolved determination of atomic displacements within the ideal structure of a crystal. These deviations of atomic positions will be characterized both in low-dimensional systems and under external influences like temperature, mechanical stress as well as electric and magnetic fields. Tuning to maximal destructive interference by means of varying the incident X-ray photon energy attains the essential increase of sensitivity. The method will be verified for selected ternary and quaternary oxides, which are in prime focus of current research. Theoretical first-principle modelling will support the interpretation of the experimentally determined deviations and ensure physio-chemical conclusiveness. An experimental characterization method with extreme accuracy in terms of phase-resolved atomic displacements in crystalline structures is expected from this project.

该项目旨在有条不紊地增强共振 X 射线衍射，以实现理想晶体结构内原子位移的高灵敏度、相位分辨测定。这些原子位置的偏差将在低维系统中以及在温度、机械应力以及电场和磁场等外部影响下表征。通过改变入射 X 射线光子能量来调节最大相消干涉，从而实现灵敏度的本质提高。该方法将针对选定的三元和四元氧化物进行验证，这是当前研究的重点。理论第一原理模型将支持对实验确定的偏差的解释并确保物理化学结论。该项目期望在晶体结构中的相分辨原子位移方面具有极高精度的实验表征方法。

项目成果

Structure variations within RSi2 and R 2 TSi3 silicides. Part I. Structure overview

• DOI: 10.1107/s2052520620001043
• 发表时间: 2020-03
• 期刊: Acta Crystallographica Section B, Structural Science, Crystal Engineering and Materials
• 作者: M. Nentwich;M. Zschornak;Maximilian Sonntag;R. Gumeniuk;S. Gemming;T. Leisegang;D. Meyer

X-ray diffraction using focused-ion-beam-prepared single crystals

使用聚焦离子束制备的单晶进行 X 射线衍射

• DOI: 10.1107/s1600576720003143
• 发表时间: 2020
• 期刊: Journal of Applied Crystallography
• 影响因子: 6.1
• 作者: T. Weigel;C. Funke;M. Zschornak;T. Behm;H. Stöcker;T. Leisegang;D. C. Meyer
• 通讯作者: D. C. Meyer

Structure variations within RSi2 and R 2Si3 silicides. Part II. Structure driving factors

• DOI: 10.1107/s2052520620003893
• 发表时间: 2020-05
• 期刊: Acta Crystallographica Section B, Structural Science, Crystal Engineering and Materials
• 作者: M. Nentwich;M. Zschornak;Maximilian Sonntag;R. Gumeniuk;S. Gemming;S. Gemming;T. Leisegang;D. Meyer-D.-M

Analysis of the defect clusters in congruent lithium tantalate

• DOI: 10.1103/physrevmaterials.2.013804
• 发表时间: 2018-01
• 期刊: Physical Review Materials
• 影响因子: 3.4
• 作者: A. Vyalikh;M. Zschornak;T. Köhler;M. Nentwich;T. Weigel;J. Hanzig;R. Zaripov;E. Vavilova;S. Gem