Characterization of Molecular Interaction in the Condensed Phase and at Interfaces by IR-Spectroscopy (C03)

N-杂多环层和含有这种分子的功能层体系将以非破坏性的方式用红外光谱进行表征。在这里，对典型各向异性体系的复介电张量的定量测定是核心，以便从这一精确信息中获得关于分子结构和排列、分子相互作用、电荷转移、极化子红外激发、混合体系中的分凝和降解的信息。这一结果将加深对固体和界面分子行为的基本认识，从而有助于更好地控制和优化半导体性质。对于非均匀体系的表征，远场红外光谱将由一种纳米分辨率的现代近场方法来完成。

Layers of N-heteropolycycles and functional layer systems with such molecules will be characterized by IR spectroscopy in a non-destructive manner. There, the quantitative determination of the complex dielectric tensor of the typically anisotropic systems is at the centre in order to obtained from that precise information on the molecular structure and arrangement, on molecular interactions, charge transfer, polaronic IR excitations, segregation in mixed systems, and degradation. The results will improve the basic understanding of the molecular behaviour in the solid and at interfaces and thus serve to better control and optimize the semiconductor properties. For the characterization of inhomogeneous systems, the far-field IR spectroscopy will be completed by a modern near-field method with a nanometer resolution.