Enabling high-resolution imaging and spectroscopy of electron beam sensitive hybrid material systems (A12)

该CRC研究的杂化无机/有机体系（HIOS）非常特殊的光电性质在很大程度上取决于无机/有机界面上的电子结构和电荷分布。全息成像技术在透射电子显微镜允许静电势，电场和电荷分布成像。该项目使用的最先进的电子能量损失光谱技术提供了亚纳米大小的电子结构探针，能量分辨率约为5兆电子伏。基于这两种原理的新技术将被开发出来，以尽量减少电子束对样品的损伤。然后将对光束敏感的HIOS进行表征，以揭示电荷密度图和可与理论相比较的局部介电函数。

The very special opto-electronic properties of hybrid inorganic/organic systems (HIOS) being investigated within this CRC are largely determined by the electronic structure and distribution of charges at the inorganic/organic interface. Holographic imaging techniques in transmission electron microscopy allow electrostatic potentials, electric fields, and charge distributions to be imaged. State of the art electron energy-loss spectroscopy available to this project provides a sub-nanometer-sized probe of the electronic structure with approximately 5 meV energy resolution. Novel techniques based on both of these principles will be developed to minimize the electron beam damage to the sample. Beam-sensitive HIOS will then be characterized to reveal maps of charge density and local dielectric function that can be compared to theory.