ERA NANOSCI: Characterization of electronic nanodevices by noise measurements

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Recently, it has been discovered that noise generated by electronic devices contains valuable information on microscopic transport processes not available from measurements of the current-voltage characteristics. While measurements of the noise spectrum are standard now at several laboratories, the determination of higher order noise cumulants is currently still an experimental challenge. From theoretical considerations there is considerable interest in getting access to these quantities. The proposal will focus and novel strategies to measure higher order noise cumulants by means of on-chip noise detectors. Theoretical work will analyse possible complications of the data analysis due to, e.g., detector feedback, environmental effects and spurious external noise, while experimental work will fabricate and employ onchip noise detectors for the characterization of electronic nanostructures.