Focused ion beam scanning electron microscope (FIB-SEM)

该仪器将用于多孔板格式的小规模和/或半高通量图像筛选应用。荧光模式将允许具有快速采集和/或高分辨率的多个检测通道；集成的软件分析模块将允许大规模的图像分析和强大的数据管理。该仪器将与其他核心设施一起放置在成像核心设施中，作为基于仪器的服务的中心场所。

The instrument is going to be used for small-scale and/or semi-high-throughput image screening applications in multi-well plate format. The fluorescence mode will allow for multiple detection channels with fast acquisition and/or high resolution; and the integrated software analysis module will allow for large-scale image analysis and robust data management. The instrument will be placed in an imaging core facility, together with other core facilities, to serve as a central place for instrument-based services.