Development of in situ soft X-ray absorption spectroscoy for analysis of ceramics materials in high temperature devices

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In this work, in situ soft X-ray absorption spectroscopic technique, which can be used to analyze electronic structures of functionalized oxides under controlled atmosphere, temperature and polarization, was established. By applying the differential evacuation system for ambient pressure soft x-ray spectrocopy togehter with the specific sample holder developed in this work, in situ soft X-ray absroption spectroscopic measurements were made possible at high temperature while controlling atmosphere under polarization. Through measurements with LaCoO3 and La2NiO4 as model oxides, it was found that absorption spectra could be clearly obtained below 873 K of temperature and 0.01 bar of oxygen partial pressure.The established in situ analytical technique can be a powerful and versatile tool for the direct observation of electronic structures of functionalized oxides used for high temperature devices.