Application of image-intensifier for the development of the direct observation of weak images of electron-microscope

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Electron-microscopy has provided information on a wide variety of materials problems. With the availability of electron-microscopes with a high-resolution its field of application has been extended greatly.In recent years, "in situ" observation of various phenomena within the specimen holder has caught the interest of many investigators, where bright images with a high resolution are indispensable. Cases are also often met with, which we can obtain only considerably thick specimens. In each case, we need such a strong radiation of electron beam or a long exposure time to record pictures on conventional films as the specimens are in danger of being totally damaged. There are also another cases the specimen essentially suffer serious damage even by fairly weak irradiation. It was the purpose of the present investigation to develop a system suitable for obtaining bright images with high contrast using only a weak electron beam by containing a microchannel plate (MCP), the quality of which has been rapidly augmented, into the electron-microscope. A set of mount and flange has been specially designed in order to include the MCP into the electron-microscope. Furthermore, a high-sensitive TV camera, a video tape recorder and a personal computer have been arranged in line with the total planning. In the last result of the present investigation, we could reduce the total amount of the radiation of electron beam to around 1/50 compared with the conventional technique to record the same picture. The effect of the electron amplification of the MCP has brought a marked increase in the brightness and a distinct improvement in the resolution of the whole system. Hence our present purpose has been successfully achieved.