Inter-atomic correlated decay processes in doped helium nanodroplets – probing heterogeneous nanosystems with EUV radiation

掺杂氦纳米液滴中的原子间相关衰变过程 â 用 EUV 辐射探测异质纳米系统

• 批准号: 409086560
• 负责人: Dr. Ltaief Ben Ltaief
• 金额: --
• 依托单位: Institut for Fysik og Astronomi
• 依托单位国家: 德国
• 项目类别: Research Fellowships
• 财政年份: 2018
• 资助国家: 德国
• 起止时间: 2017-12-31 至 2020-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/409086560?language=en
• 关键词: Inter; atomic; correlated; decay; processes

This research project mainly aims at studying inter-atomic correlated decay processes in pure and doped He nanodroplets in the extreme-ultraviolet (EUV) up to the X-ray spectral ranges using synchrotron and ultrashort laser radiation. Novel correlated decay processes will be identified and characterized, which arise from the particular electronic structure of He (two-electron system, high-lying excited states and high ionization energy), the quantum fluid nature of He nanodroplets (high mobility of localized excitations), many-body interactions (two and many-body interatomic energy and charge transfer), and exotic combinations of species in hetero-clusters (He, metals, organic molecules, shells of water molecules, etc.). This quest will lead us toward a deeper understanding of the fundamental aspects of superfluidity on the nanoscale, and elucidate the role of geometric effects (bulk vs. surface) in the photodynamics of heterogeneous nanostructures. In particular, generic photo-physical processes of nanometer-sized doped He nanodroplets such as nanosolvation of neutrals and cations vs. expulsion of excited species and anions will be elucidated. These studies will contribute to the understanding of radiation damage in tailored nano-systems and in organic materials, as well as provide concepts and reference data for interpreting recent and upcoming Free-electron laser (FEL) experiments. These goals will be pursued by systematically investigating various systems (pure and doped He nanodroplets of various sizes and composition, Ne clusters), using different experimental detection techniques such as photoelectron-photoion coincidence detection (PEPICO) technique with velocity-map imaging (VMI) capability and EUV and visible fluorescence detection method. This proposed experimental work will be carried out at various locations, e.g. the AMO beamline of ASTRID2 synchrotron radiation facility at Aarhus University, FEL at FLASH in Hamburg and Fermi@Elettra in Trieste.

本研究项目主要利用同步辐射和超短激光研究了纯和掺杂He纳米液滴在极紫外线(EUV)直至X射线光谱范围内的原子间关联衰变过程。新的相关衰变过程将被识别和表征，这些过程源于He的特殊电子结构(双电子系统、高激发态和高电离能)、He纳米液滴的量子流体性质(定域激发的高迁移率)、多体相互作用(两体和多体原子间的能量和电荷转移)以及异质团簇中物种的奇异组合(He、金属、有机分子、水分子的壳层等)。这一探索将使我们更深入地理解纳米尺度上超流的基本方面，并阐明几何效应(体效应与表面效应)在非均质纳米结构光动力学中的作用。特别是，纳米掺杂He纳米液滴的一般光物理过程，如中性和阳离子的纳米溶解与激发物种和阴离子的排出将被阐明。这些研究将有助于理解定制纳米系统和有机材料中的辐射损伤，并为解释最近和即将到来的自由电子激光(FEL)实验提供概念和参考数据。为了实现这些目标，将使用不同的实验检测技术，如具有速度图成像(VMI)能力的光电子-光离子符合检测(PEPICO)技术和EUV和可见荧光检测方法，系统地研究各种系统(不同尺寸和组成的纯和掺杂He纳米液滴，Ne团簇)。这项拟议的实验工作将在不同地点进行，例如奥胡斯大学ASTRID2同步辐射设施的AMO光束线、汉堡闪光的自由电子激光和的里雅斯特的Fermi@Elettra。

项目成果

A multipurpose end-station for atomic, molecular and optical sciences and coherent diffractive imaging at ELI beamlines

• DOI: 10.1140/epjs/s11734-021-00192-z
• 发表时间: 2021-05
• 期刊: The European Physical Journal Special Topics
• 作者: E. Klimešová;O. Kulyk;Md. Ziaul Hoque;A. Roos;K. Khakurel;M. Rebarz;M. Jurkovič;M. Albrecht;O. Finke;R. Lera;O. Hort;D. Mai;J. Nejdl;M. Sokol;R. B. Fink;L. Ben Ltaief;D. Westphal;A. Wolf;T. Laštovička;F. Frassetto;L. Poletto;J. Andreasson;M. Krikunova

Photoelectron Spectroscopy of Coronene Molecules Embedded in Helium Nanodroplets

嵌入氦纳米液滴中的晕苯分子的光电子能谱

• DOI: 10.1007/s10909-020-02553-9
• 期刊: Journal of Low Temperature Physics
• 影响因子: 2
• 作者: L. Ben Ltaief;M. Shcherbinin;S. Mandal;S. R. Krishnan;R. Richter;S. Turchini;N. Zema;M. Mudrich
• 通讯作者: M. Mudrich

Fragmentation dynamics of doubly charged camphor molecule following C 1s Auger decay.

• DOI: 10.1039/d1cp05176h
• 发表时间: 2022-01
• 期刊: Physical chemistry chemical physics : PCCP
• 作者: S. Sen;S. Mandal;Arnab Sen;R. Gopal;L. Ben Ltaief;S. Turchini;D. Catone;N. Zema;M. Coreno;R. Richter;M. Mudrich;S. Krishnan;V. Sharma