Atomic scale ion microscopy via laser cooling and correlated imaging

点击翻译按钮获取中文摘要

This project will develop next-generation focused ion beam microscopy and nanofabrication using a novel cold ion source based on photoionisation of a laser-cooled atom beam. The low temperature and complex internal state structure of the constituent atoms combine to allow generation of ions with unprecedented brightness and resolution. We will use three unique and innovative ideas: field ionisation of atoms in so-called 'exceptional' states to reduce chromatic aberration; electron-ion correlations to enhance control of the ions at the nanoscale; and atom-atom interactions to isolate and manipulate individual ions. The new technology will enable advances in semiconductor nanofabrication and material characterisation.