Observation of high resolution elemental mapping images using a high sensitivity detector

使用高灵敏度探测器观察高分辨率元素映射图像

基本信息

  • 批准号:
    04452103
  • 负责人:
  • 金额:
    $ 4.03万
  • 依托单位:
  • 依托单位国家:
    日本
  • 项目类别:
    Grant-in-Aid for General Scientific Research (B)
  • 财政年份:
    1992
  • 资助国家:
    日本
  • 起止时间:
    1992 至 1993
  • 项目状态:
    已结题

项目摘要

1. Development of a dedicated detector for elemental mapping(1) Construction of a detection system : In order to realize a fast elemental mapping, which displays images of elemental concentration, by use of the parallel electron energy loss spectroscopy (PEELS) and the scanning transmission electron microscopy (STEM), a moderate-scale photodiode arrray (PDA) of 35 channel was used to acquire energy loss spectra. Electric circuits and computer programs were also developed to control the elemental mapping system. Spectrum acquisition time for one pixel is 1.2 msec which is 20 times shorter than that of conventional 1024 channel PDA.(2) Measurements of fundamental properties of the detector : A windowless PDA was prepared to decrease the leakage of light from the electron scintillator in transmission from the window to elements of the PDA, and the cross talk was reduced to 4 % of total output current of the PDA.Measurement of the detective quantum efficiency (DQE) of the detector showed that the DQE decreases in a low electron intensity region, where the elemental mapping is usually carried out, due to electromagnetic disturbance. This result indicates that more effective electromagnetic shield is required.2. Achievement of high current density electron probe by spherical aberration correctionIn order to obtain high resolution elemental mapping images, spherical aberration of the probe-forming lens was corrected with a foil lens. It was found, theoretically and experimentally that the foil lens allows a high current density and should be useful for a low intensity spectrum.3. Observation of elemental mapping imagesIn elemental mapping images of boron nitride on a carbon microgrid, the microgrid and the boron intride were clearly discriminated. With nickel oxide, which have excitation edges in a high energy loss and low intensity region, elemental mapping images were observed as a result of the high sensitivity of the detector.
1.(1)探测系统的构建:为了实现快速元素定位,利用并行电子能量损失谱(PEELS)和扫描透射电子显微镜(STEM),利用35通道的中尺度光电二极管阵列(PDA)获取能量损失谱,并显示元素浓度图像。还开发了电路和计算机程序来控制元素映射系统。一个像素的光谱采集时间为1.2毫秒,比传统的1024通道PDA短20倍。(2)探测器基本特性的测量:设计了一种无窗PDA,以减少电子闪烁体的光从窗口到PDA元件的泄漏,使串扰降低到PDA总输出电流的4%。测量了探测器的量子探测效率(DQE),发现在低电子强度区DQE降低,其中由于电磁干扰,通常执行元素映射。这一结果表明需要更有效的电磁屏蔽.用球差校正法实现高电流密度电子探针为了获得高分辨率的元素分布图像,用箔透镜校正了探针形成透镜的球差。从理论和实验上发现,箔透镜允许高电流密度,并应适用于低强度光谱。3.在碳微网格上的氮化硼的元素映射图像中,可以清楚地区分微网格和氮化硼。对于在高能量损失和低强度区域中具有激发边缘的氧化镍,由于检测器的高灵敏度,观察到元素映射图像。

项目成果

期刊论文数量(30)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
日比野 倫夫: "薄膜レンズによる球面収差補正ー3次と5次の球面収差を考慮した位相コントラスト伝達関数と単原子像コントラストのシミュレーションー" 日本電子顕微鏡学会 高性能電子顕微鏡技術研究部会予稿集. 7-11 (1992)
日比野道雄:“使用薄膜透镜校正球面像差 - 考虑三阶和五阶球面像差的相衬传递函数和单原子图像对比度的模拟”日本电子学会高性能电子显微镜技术研究组论文集显微镜。 7 -11 (1992)
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    0
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Takaaki HANAI: "Effect of the three-fold astigmatism on the foil lens used for correction of the spherical aberration of a probe-forming lens." Optik. vol.94, No.2 (in print). (1994)
Takaaki HANAI:“三重像散对用于校正探针形成透镜球面像差的箔透镜的影响。”
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    0
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日比野 倫夫: "Spectrum-acquisition imaging system for STEM elemental mapping using PEELS with a moderate-scale detector." Proc.7th Chinese-Japanese Electron Microscopy Seminar(in print). (1993)
Michio Hibino:“使用带有中等规模探测器的 PEELS 进行 STEM 元素映射的光谱采集成像系统。”第七届中日电子显微镜研讨会(印刷中)。
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    0
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Michio HIBINO: "The signal to noise ratio of low dose images observed by TEM and STEM." Proc.5th Asia-Pacific Electron Microscopy Conference. vol.1. 94-95 (1992)
Michio HIBINO:“TEM 和 STEM 观察到的低剂量图像的信噪比。”
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    0
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日比野 倫夫: "Characteristics of YAG single crystals for electron scintillator of STEM" Journal of Electron Microscopy. 41. 453-457 (1992)
Michio Hibino:“STEM 电子闪烁体用 YAG 单晶的特性”《电子显微镜杂志》41. 453-457 (1992)。
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HIBINO Michio其他文献

HIBINO Michio的其他文献

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{{ truncateString('HIBINO Michio', 18)}}的其他基金

Fundamental Study on a High Brightness and High Resolution YAG Screen for Electron Microscopy
电子显微镜用高亮度高分辨率YAG屏幕的基础研究
  • 批准号:
    07455036
  • 财政年份:
    1995
  • 资助金额:
    $ 4.03万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
On line digital manipulation process of elastically and inelastically scattered electron signals in scanning transmission electron microscopy
扫描透射电子显微镜中弹性和非弹性散射电子信号的在线数字处理过程
  • 批准号:
    63850078
  • 财政年份:
    1988
  • 资助金额:
    $ 4.03万
  • 项目类别:
    Grant-in-Aid for Developmental Scientific Research
Research on High Resolution Electron Microscope Observations without Specimen Damage
不损伤标本的高分辨率电镜观察研究
  • 批准号:
    62420021
  • 财政年份:
    1987
  • 资助金额:
    $ 4.03万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (A)
Developemtn of High Resolution Scanning Transmission Electron Microscope through Spherical Aberration Correction by Means of a Foil Lens
箔透镜球差校正高分辨率扫描透射电子显微镜的研制
  • 批准号:
    61850069
  • 财政年份:
    1986
  • 资助金额:
    $ 4.03万
  • 项目类别:
    Grant-in-Aid for Developmental Scientific Research
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