课题基金 / 基金详情

Measurement of heat transfer in sub-micron area of thin films by transmission electron microscope

Measurement of heat transfer in sub-micron area of thin films by transmission electron microscope
透射电子显微镜测量薄膜亚微米区域的传热
批准号:
05650052
负责人:
TAKAOKA Akio
金额:
$1.22万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for General Scientific Research (C)
财政年份:
1993
资助国家:
日本
项目状态:
已结题
起止时间:
1993 至 1994

项目摘要

项目成果

TAKAOKA Akio的其他基金

相似基金

相关文献

中文摘要
翻译
利用透射电子显微镜(TEM)的高空间分辨率(-nm),研究了一种测量薄膜热导率的方法,并将其应用于厚度为30- 300 nm的多晶薄膜,通过薄膜的电子被晶格的热振动散射,TEM图像上的电子束强度随样品温度的变化而变化。当激光束聚焦在薄膜上时,薄膜可以被局部、快速和重复地加热。在透射电镜上安装了一个带有振幅调制器的He-Ne激光器和一个聚焦和准直的光学系统,将10 mW左右的激光束聚焦到直径为10- 20 μ m的样品上。用闪烁体和光电倍增管观察样品的放大像,并在样品上测量小范围内(1 μ m)的光束强度,利用热容和热扩散率延迟薄膜温度的上升。将相位差转换为热导率。制备了不同厚度的真空沉积膜(Al,Sn,Ni,Ge,Cu,Mg,Bi),并进行了测量。在大多数情况下,薄膜电导率为体电导率的30-80%,并随着晶粒尺寸的增加而接近体电导率。在工程实施过程中,我们还没有完成传热与晶体结构之间关系的研究。这将被连续研究。
英文摘要
With the high-spatial resolution (-nm) of transmission electron microscopes(TEM), a measurement method of thermal conductivity of thin films is investigated and it is applied to polycrystalline films whose thickness is 30-300nm.Electrons through a film are scattered by the thermal vibration of lattice and the beam intensity at TEM image changes by the temperature of the specimen. When the laser beam is focused on a film, the film can be heated locally, quickly and repeatedly. combining these functions, we can investigate the mechanize of heat transfer in this films.A He-Ne gas laser with amplitude modulator and an optical system for focusing and aligning are attached to the TEM.The laser beam with about 10mW is focused on the specimen to the area of 10-20mum in diameter. The magnified image of the specimen is observed and the beam intensity in a small area (1mumphi on specimen) is detected by a scintillator and a photo-multiplier.The rise of film temperature is delayd to the laser power by the heat capacity and heat diffusivity. The phase difference is converted to the thermal conductivity. Then, this method has advantage that the deduction is independent to the absolute temperature and the film thickness.Some vacuum-deposited films (Al, Sn, Ni, Ge, Cu, Mg, Bi) with various thicknesses are prepared and measured. In most cases, film conductivity is in 30-80% of bulk conductivity and approaches to it as the grain size increases. The film conductivity reduces as the thickness decreases.In the term of project, we have not finished the investigation to the relation between heat transfer and crystal structure. This will be studied in succession.
期刊论文(10)
专著(0)
科研奖励(0)
会议论文
A.Takaoka and R.Nishi: "Measurement of thermal concluctivity of thin films with TEM" Proc,13th Int.Congr.on Electron Microscopy 1994. 1. 261-262 (1994)
A.Takaoka 和 R.Nishi:“用 TEM 测量薄膜的热凝结率”Proc,第 13 届电子显微镜国际会议 1994. 1. 261-262 (1994)
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
Akio Takaoka and Katsumi Ura: ""Accuracy of temperature measurement in micro-area of polycrystalline film with transmission electron microscope"" Meas.Sci.Technol.Vol.5 No.1. 105-109 (1994)
Akio Takaoka 和 Katsumi Ura:“利用透射电子显微镜测量多晶薄膜微区温度的精度”Meas.Sci.Technol.Vol.5 No.1。
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
Akio Takaoka and Ryuji Nishi: ""Measurement of thermal conductivity of thin films with TEM"" Proc.13th Int.Congr.on Electron Microscopy. Vol.1. 261-262 (1994)
Akio Takaoka 和 Ryuji Nishi:“用 TEM 测量薄膜的热导率”Proc.13th Int.Congr.on Electron Microscopy。
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
A.Takaoka and R.Nishi: "Measurement of thermal conductirity of thin films with TEM" Proc.13th Int Congr on Electron Microscopy,1994. 1. 261-262 (1994)
A.Takaoka 和 R.Nishi:“用 TEM 测量薄膜的热导率”Proc.13th Int Congr on Electron Microscopy,1994。
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
6
    Development of automatic electron microscope for tomography and application to cell biology
    • 批准号:
      17500305
    • 项目类别:
      Grant-in-Aid for Scientific Research (C)
    • 资助金额:
      $1.92万
    • 财政年份:
      2005
    • 负责人:
      TAKAOKA Akio
    • 依托单位:
    Electron Optics of Electron Beam Lithography System with Multi-Micro Columns
    • 批准号:
      13650377
    • 项目类别:
      Grant-in-Aid for Scientific Research (C)
    • 资助金额:
      $2.05万
    • 财政年份:
      2001
    • 负责人:
      TAKAOKA Akio
    • 依托单位:
    Temperature measurement on submicron-area of thin films by using electron beam
    • 批准号:
      02650030
    • 项目类别:
      Grant-in-Aid for General Scientific Research (C)
    • 资助金额:
      $1.22万
    • 财政年份:
      1990
    • 负责人:
      TAKAOKA Akio
    • 依托单位:
    海外基金