High resolution analytical transmission electron microscope

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The Institute of Micro and Nanostructure Research (IMN) runs the electron microscopy facility of the Center for Nanoanalysis and Electron Microscopy (CENEM), an interdisciplinary center and user facility of the Friedrich-Alexander Universität (FAU) Erlangen-Nürnberg. CENEM provides FAU’s researchers with high-resolution and nanoanalytical techniques for advanced materials characterization. In the area of transmission electron microscopy CENEM is equipped with a double-corrected monochromated TEM/STEM, installed in 2014, and a 25 years old conventional TEM with basic analytics (EDXS). For the latter the manufacturer does not guarantee service anymore and terminated the service contract in 2017. The microscope is still operative and used in the facility. However, a long-term usage cannot be guaranteed anymore. Another 25 years old high-resolution TEM of CENEM has already been dismantled in 2017 due to increasing hardware problems. Due to its high complexity of the double-corrected monochromated TEM/STEM can only be operated by highly trained members of IMN and CENEM. Therefore, only the conventional TEM is currently available for own work by CENEM’s users. In order to replace the two old microscopes and provide our users with state-of-the-art TEM methods, we apply for a modern high-resolution TEM/STEM with capabilities for efficient analytical work (EDXS, EELS) as well as electron tomography. The users of CENEM’s electron microscopy facility come from various institutes of FAU and work on materials related problems in materials science, physics, chemistry, process engineering and related areas. The advanced capabilities of the new microscope will also be used by the members of IMN for research in various collaborative research projects, including SFB 953, SFB-TR 103, GRK 1896, SFB 1411 (under review), and two proposed SFBs on catalysis at liquid interfaces and on liquid phase epitaxy. In order to be able to address the steadily increasing demand for high-resolution analytics, 3D characterization and in situ TEM, the requested TEM/STEM instrument is equipped with a probe-corrector, a high-brightness electron source with small energy spread, a fast camera, a large-area EDX detector (for fast mappings and high sensitivity), a state-of-the-art EEL spectrometer, and capabilities for electron tomography. Based on compatibility of the requested TEM with the unique set of in situ sample holders at CENEM we also plan to use the new instrument for advanced in situ TEM work in the various collaborative research projects.