"Evaluation of Three-Dimensional Residual Stress in Bonding Layr with Polarized Laser"
"Evaluation of Three-Dimensional Residual Stress in Bonding Layr with Polarized Laser"
批准号:
05805010
负责人:
NIITSU Yasushi
金额:
$1.28万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for General Scientific Research (C)
财政年份:
1993
资助国家:
日本
项目状态:
已结题
起止时间:
1993 至 1994
中文摘要
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英文摘要
Optical birefringence was measured by a high frequency modulation method using a photoelastic modulator and a polarized laser. This measurement has the high sensitivity required to measure small birefringence produced by stress. The following results were obtained with developed measurement.(1) The optical birefringence distributions were measured for the bonded rectangular glass plates with epoxy resin. With those results, the residual stress distribution in adhesive layr caused by the bonding process was evaluated. Consequently, the maximum tensile stress applied at the side and corner, and the biaxial tension applied at the inside.(2) The new synthesized photoelastic method was developed for calculation of stress and its direction with laser potoelasticity measurement. The distributions of optical birefringence corresponding to stress were measured for the tensile glass plates with a hole and notches. Measured stress distributions agreed well with the FEM analysis, and it was confirmed that the new method would be useful to detect the microscopical stress fields.(3) I tried to evaluate the three dimensional stress distribution from two dimensional its projection. But it was difficult analytically. The combination of FEM and experimental results has possibility of three dimensional stress evaluation.
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Y.NIITSU,K.ICHINOSE and K.IKEGAMI: "Stress Measurement of Transparent Materials by Polarized Laser" Trans.of JSME,Series-A. Vol.59, No.559. 600-605 (1993)
Y.NIITSU、K.ICHINOSE 和 K.IKEGAMI:“偏振激光透明材料的应力测量”Trans.of JSME,Series-A。
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Y.NIITSU and K.GOMI: "Influence of Crystal Orientation on Photoelastic Properties of Silicon Single Crystal" Proc.of Advanced in Electronic Packaging. Vol.10-2. 1239-1245 (1995)
Y.NIITSU 和 K.GOMI:“晶体取向对硅单晶光弹性特性的影响”Proc.of Advanced in Electronic Packaging。
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Yasushi NIITSU: "Accuracy Evaluation of Stress Measurement in Silicon Crystal by Microscopic Raman Spectroscopy" Proc.of Int.Electronics Packaging Conference. 1. 255-259 (1993)
Yasushi NIITSU:“通过显微拉曼光谱对硅晶体中的应力测量进行准确度评估”国际电子封装会议论文集。
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K.ICHINOSE and Y.NIITSU: ""Experimental stress analysis by Shear Difference Method using Results of Synthesized Method"" Proc.of JSME Annual Meeting. No.95-1, Vol.2. 626-627 (1995)
K.ICHINOSE 和 Y.NIITSU:““使用合成方法结果通过剪切差法进行实验应力分析””JSME 年会论文集。
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Yasusi NIITSU: "Stress Measurement of Transparent Materials by Polarized Laser" JSME Int. J. Series-A. Vol.38 No.1. 68-72 (1995)
Yasusi NIITSU:“偏振激光透明材料的应力测量”JSME Int。
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共 23 条
Monitoring of Bridge Displacement with Image Correlation Method
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批准号:23560578
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$3.41万
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财政年份:2011
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负责人:NIITSU Yasushi
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依托单位:
Development of 3D Solid Modeler and its Contents for Education of Mathematics
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批准号:15500637
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资助金额:$2.37万
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财政年份:2003
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负责人:NIITSU Yasushi
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依托单位:
"Stress Evaluation of Silicon Single Crystal by Laser Raman Spectroscopy"
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批准号:10650098
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$1.92万
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财政年份:1998
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负责人:NIITSU Yasushi
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依托单位:
"Development of Scanning Laser Micro-polariscope and its Applications for Stress Evaluation"
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批准号:07555034
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$3.01万
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财政年份:1995
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负责人:NIITSU Yasushi
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依托单位:
Development of Stress Measurement of Silicon Single Crystal by Infrared Polarized Laser
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批准号:05555035
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项目类别:Grant-in-Aid for Developmental Scientific Research (B)
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资助金额:$3.58万
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财政年份:1993
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负责人:NIITSU Yasushi
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依托单位:
海外基金