课题基金 / 基金详情

ダイヤモンド薄膜表面の導電性制御によるハイパワー高周波トランジスタの開発

ダイヤモンド薄膜表面の導電性制御によるハイパワー高周波トランジスタの開発
通过控制金刚石薄膜表面的电导率开发高功率高频晶体管
批准号:
15206043
负责人:
KAWARADA Hiroshi
金额:
$30.28万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (A)
财政年份:
2003
资助国家:
日本
项目状态:
已结题
起止时间:
2003 至 2005

项目摘要

项目成果

KAWARADA Hiroshi的其他基金

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中文摘要
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英文摘要
Four of the elemental techniques were developed to improve the performance and the stabilization of the diamond transistors. (1)Fabrication technique of the low resistive layer, less than 1kΩ/sq, utilizing focused ion beam. (2)Deposition technique of the thermally stable ultrahigh-concentration boron doped diamond(specific resistance : 2×10^<-4>[Ωcm], boron concentration 1.4×10^<22>cm^<-3>]). (3)Film formation technique of high quality Al_2O_3 gate insulator with very low gate leakage current, three orders of magnitude smaller than the conventional CaF_2 insulator film. (4)Control of the threshold voltage with ozone treatment aimed at low dissipation power.De-embedding method, the most widely used method for the evaluation of RF devices, was employed to evaluate the intrinsic characteristics of the diamond MISFETs. And the normal effective field dependency of the mobility of the hole accumulation layer was clarified aimed at analyzing the carrier traveling mechanism in the accumulation … More layer. As device fabrication process technology, the self-alignment technique for the fabrication of the fine gate with less than 0.2μm gate length, and the T-shape gate electrode fabrication process for lowering the gate resistance were established.The diamond MISFETs were fabricated utilizing the fine process technology described before. An f_T cut-off frequency of 30GHz and an f_<max> cut-off frequency of 48GHz were obtained for the 0.15μm gate length MISFETs. And the fabrication of diamond MISFETs with Al_2O_3 gate insulator has been succeeded. They yield f_T=30GHz and f_<max>=6oGHzz for the thickness of gate insulator of 3nm and the gate length of 0.3μm. In addition, we have employed load-pull measurement on diamond MISFETs for the first time and obtained 2.14W/mm output power density at 1GHz for the gate length of 100μm and the gate length of 0.3μm. The value is superior to the reported power density of GaAs FETs or Si LDMOS ; therefore it confirms the advantage of the diamand MISFETs as high power RF transistor. Less
期刊论文(156)
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DOI: 10.1063/1.1802389
发表时间: 2004-06
期刊: Applied Physics Letters
影响因子: 4
作者: [Y. Takano;M. Nagao;K. Kobayashi;H. Umezawa;I. Sakaguchi;M. Tachiki;T. Hatano;H. Kawarada]
通讯作者: Y. Takano;M. Nagao;K. Kobayashi;H. Umezawa;I. Sakaguchi;M. Tachiki;T. Hatano;H. Kawarada
Over 20 GH_2 Cut-Off Frequency Deep Sub-micron Gate Diamond MISFET
超过 20 个 GH_2 截止频率深亚微米栅极金刚石 MISFET
DOI: --
发表时间: 2004
期刊: IEEE Elect. Dev. Lett. 25(7)
影响因子: --
作者: [H.Matsudaira, S.Miyamoto, H.Ishizaka, H.Umezawa, H.Kawarada]
通讯作者: H.Kawarada
Over 20 GHz Cut-Off Frequency Deep Sub-micron Gate Diamond MISFET
超过 20 GHz 截止频率深亚微米栅极金刚石 MISFET
DOI: --
发表时间: 2004
期刊: IEEE Elect.Dev.Lett. 25(7)
影响因子: --
作者: [H.Matsudaira, S.Miyamoto, H.Ishizaka, H.Umezawa, H.Kawarada]
通讯作者: H.Kawarada
Y.Kaibara, K.Sugata, M.Tachiki, H.Umezawa, H.Kawarada: "Control Wettability of the Hydrogen-Terminated Diamond Surface and the Oxidized Diamond Surface using the Atomic Force Microscope"Diam.Relat.Mater.. 12. 560-564 (2003)
Y.Kaibara、K.Sugata、M.Tachiki、H.Umezawa、H.Kawarada:“使用原子力显微镜控制氢封端金刚石表面和氧化金刚石表面的润湿性”Diam.Relat.Mater.. 12。
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
51
    Electron Spin Control of Diamond by Surface Carrier and its Application to Nuclear Spin Detection of Bio-Molecules
    • 批准号:
      26220903
    • 项目类别:
      Grant-in-Aid for Scientific Research (S)
    • 资助金额:
      $121.72万
    • 财政年份:
      2014
    • 负责人:
      KAWARADA Hiroshi
    • 依托单位:
    aptamer
    • 批准号:
      23246069
    • 项目类别:
      Grant-in-Aid for Scientific Research (A)
    • 资助金额:
      $31.45万
    • 财政年份:
      2011
    • 负责人:
      KAWARADA Hiroshi
    • 依托单位:
    Development of High Power and Millimeter-long Wave Diamond Transistors Using Two Dimensional Hole Gas
    • 批准号:
      19106006
    • 项目类别:
      Grant-in-Aid for Scientific Research (S)
    • 资助金额:
      $65.4万
    • 财政年份:
      2007
    • 负责人:
      KAWARADA Hiroshi
    • 依托单位:
    High breakdown voltage and high frequency field-effect transistors on heteroepitaxial diamond film.
    • 批准号:
      10450127
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $8.64万
    • 财政年份:
      1998
    • 负责人:
      KAWARADA Hiroshi
    • 依托单位: