Transmission electron microscope of the 120 kV class, with preparation equipment

所要求的TEM将用于分析物理、化学、医学和工程科学中的材料，包括形状、尺寸和性质（在真实的空间中）、结晶度（在TEM衍射模式中，选区电子衍射SAED）、（空间分辨）化学成分（通过STEM/EDS）、形态（通过断层扫描）和维度（TEM）。此外，TEM将用于快速预表征，以便在正在建设的高分辨率TEM上进行更详细的分析。首先，将研究Klinke组的纳米材料。这些主要是二维胶体半导体结构。一个焦点是钙钛矿和拓扑绝缘体的合成。为了能够快速评估合成的成功，需要120 kV级的透射电子显微镜。目前，三位博士后正在工作组中综合工作。每天都有大量的样本需要检查。快速表征使研究能够快速发展，以获得新的纳米结构和材料。此外，样品的化学（STEM/EDS）和晶体学（衍射）特性已经可以进行检测。购买这类TEM将缓解目前正在建设的高分辨率TEM的压力，因为TEM用于预表征。这同样适用于新材料领域的凯斯勒集团。然而，他们研究具有微观精细结构的宏观样品。这些样品必须通过样品制备（凹坑研磨机，离子抛光）进行处理，并可用于TEM。目前可用的设备在利用率和质量方面都不适合于有针对性的研究。

The requested TEM will be used to analyze materials from physics, chemistry, medicine and engineering sciences in respect to shape, size and nature (in real space), crystallinity (in TEM diffraction mode, selected-area electron diffraction SAED), (spatially resolved) chemical composition (by STEM/EDS), morphology (by tomography) and dimensionality (TEM). Furthermore, the TEM will be serve for fast pre-characterization for more detailed analyses at the high-resolution TEM, which is under construction. Primarily, the nanomaterials from the Klinke group will be investigated. These are mainly two-dimensional colloidal semiconductor structures. One focus is on the synthesis of perovskites and topological insulators. To be able to quickly assess the success of the synthesis, a transmission electron microscope of the 120 kV class is required. At the moment three post-docs are working synthetically in the working group. There are already numerous samples to be examined every day. Rapid characterization enables rapid progress in research in order to achieve new nanostructures and materials. In addition, the samples can already be examined in terms of their chemical (STEM/EDS) and crystallographic (diffraction) properties. The purchase of a TEM of this class will relieve the high-resolution TEM that is currently under construction, as the TEM is used for pre-characterization.The same applies to the Kessler group in the field of new materials. However, they investigate macroscopic samples with a microscopic fine structure. These samples must be processed by the sample preparation (dimple grinder, ion polishing) and made accessible to the TEM. The devices currently available are not suitable for the targeted research in terms of both utilization and quality.