Study of Undercooled Melt and Solidification Using Synchrotron Radiation and Electrostatic Levitation Technique

同步辐射和静电悬浮技术过冷熔体和凝固研究

• 批准号: 16206062
• 负责人: NANAO Susumu
• 金额: $ 31.45万
• 依托单位: University of Tokyo
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (A)
• 财政年份: 2004
• 资助国家: 日本
• 起止时间: 2004 至 2006
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-16206062/
• 关键词: melt; x-ray; atomic structure; electronic structure; containerless melting; electrostatic levitation; undercooling; 金属物性; 熱物性; 過冷状態; X線回折; 放射光; 物性実験; 動的構造; 凝固過程

Our project, which is the realization of a compact electrostatic levitator for the measurements using synchrotron radiation and measurements of x-ray diffraction, Compton scattering and high resolution x-ray inelastic scattering at Spring-8 has been fulfilled nearly as planned.(1) X-ray diffraction:High energy x-ray diffraction profiles have been precisely measured for the melts and undercooled melts of Zr, Si and Ba-Ge compunds using electrostatic levitation technique. And their structures were analyzed partly with Monte Carlo simulation.For the melt of icosahedral ALPdMn alloy, the first peak in low angle region has been clearly detected for the first time in the x-ray diffraction profile, which confirms the existence of order structure in the scale of 0.35nm in the melt.(2) Compton scattering and high resolution x-ray inelastic scattering:Compton scattering profiles for Si melt was measured at BLO8W in Spring-8. The analyses of the obtained momentum distribution of valence electrons have demonstrated the existence of covalent bonds for the first time.High resolution x-ray inelastic scattering profiles were measured for Si melt and Si undercooled melt of 1517K, and dynamic structure factor has found clearly different between them.This is the first case in the world that a profile of Compton scattering and/or high resolution x-ray inelastic scattering is successfully measured. The present studies are to be pioneering work that shows it is really possible to study dynamics and electronic structures of high temperature melt and undercooled melt.

我们的项目，这是实现一个紧凑的静电悬浮器的测量，使用同步辐射和测量的X射线衍射，康普顿散射和高分辨率的X射线非弹性散射在春天-8已完成几乎按计划。(1)X射线衍射：用静电悬浮技术精确测量了Zr、Si和Ba-Ge化合物熔体和过冷熔体的高能X射线衍射轮廓。对于二十面体ALPdMn合金熔体，首次在X射线衍射谱中清晰地检测到低角区的第一个衍射峰，证实了熔体中存在0.35nm尺度的有序结构。(2)康普顿散射和高分辨率X射线非弹性散射：在Spring-8的BLO 8 W测量了Si熔体的康普顿散射分布。对所得价电子动量分布的分析首次证实了共价键的存在.测量了1517 K的Si熔体和过冷Si熔体的高分辨X射线非弹性散射剖面，这是世界上首次用康普顿散射剖面和高分辨x-射线剖面来研究X-射线散射和X-射线动力学结构因子的差异。射线非弹性散射成功地测量。本研究是一项开拓性的工作，它表明研究高温熔体和过冷熔体的动力学和电子结构是可能的。

项目成果

in-situ identification of the metastable phase during solidification from the undercooled YFeO3 melt by fast X-ray diffractometry at 250 Hz

通过 250 Hz 快速 X 射线衍射法原位识别过冷 YFeO3 熔体凝固过程中的亚稳相

• 发表时间: 2006
• 期刊: Applied Physics Letters 89
• 作者: K.Nagashio;K.Kuribayashi;M.S.Vijaya Kumar;K.Niwata;T.Hibiya;A.Mizuno;M.Watanabe;Y.Katayama
• 通讯作者: Y.Katayama

Heat Treatment of Metastable Nd_2Fe_<17>B_x Phase Fromed from Undercooled Melt of Nd-Fe-B Alloy

Nd-Fe-B合金过冷熔体亚稳Nd_2Fe_<17>B_x相的热处理

• 发表时间: 2006
• 期刊: J. Appl. Phys. 100
• 作者: S.Ozawa;K.Kuribayashi;S.Hirosawa;S.Ruetzel;M.Herlach
• 通讯作者: M.Herlach

静電浮遊法による高温金属液体の構造解析

静电悬浮法高温金属液体结构分析

• 发表时间: 2006
• 期刊: 日本マイクログラヴィティ応用学会誌 Vol.23, No.1
• 作者: Akio;Miyazato;Ryuichi;Ito;Yuriko;Kakihana;Seiji;Tateyama,Yusuke;KAWAKAMI;正木匡彦
• 通讯作者: 正木匡彦

静電浮遊法とX線非弾性散乱法を用いた液体シリコンの原子ダイナミクスの観察

利用静电悬浮法和非弹性X射线散射法观测液态硅中的原子动力学

• 发表时间: 2007
• 期刊: Space Utiliz. Res. 23
• 作者: 正木匡彦;石川毅彦;岡田純平;小池紀之
• 通讯作者: 小池紀之

Dynamics in the Melt of an Icosahedral AL_<72>Pd_<20>Mn_s quasicrystal

二十面体AL_<72>Pd_<20>Mn_s准晶熔化动力学

• 发表时间: 2006
• 期刊: J.Phys.Condens.Matter 18
• 作者: J.T.Okada;M.Inui;D.Ishikawa;A.Q.R.Baron;K.Matsuda;S.Tsutsui;Y.Watanabe;S.Nanao;T.Ishikawa
• 通讯作者: T.Ishikawa