X-ray photoelectron spectrometer (XPS)

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Funding for an X-ray photoelectron spectrometer (XPS) is requested for measurement tasks in chemical analysis related to materials research. The following main requirements are important: (i) Daily, fully automated analysis of chemical binding states of air-sensitive materials and composites, as well as chemically modified surfaces, with lateral scanning and high spatial resolution to perform surface analysis. Imaging with simultaneous chemical information is paramount. (ii) Temperature-dependent measurement of reactive changes of interfaces and surfaces in battery materials and electrocatalysis, including the option to sputter. (iii) Ability to measure chemical states in electrochemical measurements in-situ. (iv) Depth analysis of materials to analyze burying layers, and possible measurement of density of states (valence band edges) of solids, in addition to measurements of energy gaps of molecules, surface defects and adsorbates.