X-ray photoelectron spectrometer (XPS)

X射线光电子能谱仪（XPS）

• 批准号: 525733742
• 金额: --
• 依托单位: Universität Münster
• 依托单位国家: 德国
• 项目类别: Major Research Instrumentation
• 财政年份: 2024
• 资助国家: 德国
• 起止时间: 2023-12-31 至 无数据
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/525733742?language=en
• 关键词: ray; photoelectron; spectrometer; XPS

Funding for an X-ray photoelectron spectrometer (XPS) is requested for measurement tasks in chemical analysis related to materials research. The following main requirements are important: (i) Daily, fully automated analysis of chemical binding states of air-sensitive materials and composites, as well as chemically modified surfaces, with lateral scanning and high spatial resolution to perform surface analysis. Imaging with simultaneous chemical information is paramount. (ii) Temperature-dependent measurement of reactive changes of interfaces and surfaces in battery materials and electrocatalysis, including the option to sputter. (iii) Ability to measure chemical states in electrochemical measurements in-situ. (iv) Depth analysis of materials to analyze burying layers, and possible measurement of density of states (valence band edges) of solids, in addition to measurements of energy gaps of molecules, surface defects and adsorbates.

请求在与材料研究有关的化学分析中进行X射线光电子光谱仪（XPS）的资金。以下主要要求很重要：（i）每天对空气敏感材料和复合材料的化学结合状态以及化学修饰的表面进行全自动分析，并具有横向扫描和高空间分辨率以执行表面分析。同时使用化学信息成像至关重要。 （ii）电池材料和电催化中界面和表面的反应性变化的温度依赖性测量，包括溅射的选项。 （iii）在原位测量中测量化学状态的能力。 （iv）除了测量分子，表面缺陷和崇拜者的能量差距外，还对埋葬层的材料进行了深度分析，并可能测量固体的密度（价带边缘）。