Digital Control of Terrace Width of One-dimensional Semiconductor Surfaces by Modification of Lattice Strain
通过修改晶格应变数字控制一维半导体表面的平台宽度
基本信息
- 批准号:12450024
- 负责人:
- 金额:$ 5.38万
- 依托单位:
- 依托单位国家:日本
- 项目类别:Grant-in-Aid for Scientific Research (B)
- 财政年份:2000
- 资助国家:日本
- 起止时间:2000 至 2001
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
The clean Si (110) surface shows a "16x2" reconstruction, where one-dimensional up-and-down terraces arrange alternatively. The terrace width is about 2.5 nm and the height difference between the adjacent terraces is one atomic layer, 0.2 nm. This surface is a promising substrate for future low-dimensional electronic devices as well as nano-biomaterials. In this study, we have tried to control the terrace width by a unique method using metal adsorption. This is based on the idea that the surface stress plays a role to determine the surface step density. The metal we used is a tin, which belongs the same periodic table as silicon, because homovalent doping does not so much affect electronic structures on the surface. At 0.2 ML adsorption of Sn on the surface, the 16x2 changed into 28x2, which was confirmed by low-energy electron diffraction as well as scanning tunneling microscopy. STM observation shows that Sn atoms forms trimers which are inserted accordingly into the silicon pentagonal clusters. As a result, surface stress was reduced to make the terrace width being enlarged to about 50%. In addition of structural point of view, we attempted to modify electronic nature of the up-and-down terraces by hydrogen termination technique. The result shows that, at the initial stage of reaction, atomic hydrogen reacts with specific atoms in pentagonal cluster to reduce surface stress, and that the up-and-down structure is kept at a saturation coverage of hydrogen, demonstrating the potential of this surface even in air. Ag and Ba deposition on Si(110) are now in progress
清洁的Si(110)表面呈现出“16×2”的重构,其中一维上下梯级交替排列。梯田的宽度约为2.5 nm,相邻梯田之间的高度差为一个原子层,0.2 nm。这种表面很有希望成为未来低维电子器件和纳米生物材料的衬底。在这项研究中,我们试图通过一种独特的方法来控制梯田的宽度,这种方法是利用金属吸附来实现的。这是基于表面应力对表面台阶密度起决定作用的思想。我们使用的金属是锡,它与硅属于同一元素周期表,因为同价掺杂不会对表面的电子结构产生太大影响。低能电子衍射和扫描隧道显微镜证实,当锡在表面吸附0.2ML时,16x2转变为28x2。STM观察表明,锡原子形成三聚体,并相应地插入到硅五方团簇中。结果,降低了表面应力,使梯田宽度扩大到50%左右。除了结构上的观点外,我们还尝试通过氢终止技术来改变上下阶梯的电子性质。结果表明,在反应的初始阶段,氢原子与五角团簇中的特定原子发生反应以降低表面应力,并且上下结构保持在氢的饱和覆盖下,这表明该表面即使在空气中也是潜在的。在Si(110)衬底上沉积银和钡目前正在进行中
项目成果
期刊论文数量(38)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
T.An, M.Yoshimura and K.Ueda: "Surface Structure of Si (110) "7x2" -Sn Observed by Scanning Tunneling Microscopy"Jpn.J.Appl.Phys.. 39. 4635-4636 (2000)
T.An、M.Yoshimura 和 K.Ueda:“通过扫描隧道显微镜观察到的 Si (110)“7x2”-Sn 的表面结构”Jpn.J.Appl.Phys.. 39. 4635-4636 (2000)
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- 影响因子:0
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M.Ishikawa: "Carbon nanotube as a probe for friction force microscopy"Physica B. (in press). (2002)
M.Ishikawa:“碳纳米管作为摩擦力显微镜的探针”Physica B.(出版中)。
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- 影响因子:0
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K. Ojima, M. Yoshimura and K. Ueda: "Effect of hydrogen termination on Ba reaction on the Si(100) surface"Jpn. J. Appl. Phys.. 40. 4384-4387 (2001)
K. Ojima、M. Yoshimura 和 K. Ueda:“氢终止对 Si(100) 表面 Ba 反应的影响”Jpn。
- DOI:
- 发表时间:
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- 影响因子:0
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M.Ishikawa: "A study of friction by carbon nanotube tip"Appl.Surf.Sci.. (in press). (2002)
M.Ishikawa:“碳纳米管尖端摩擦力的研究”Appl.Surf.Sci..(出版中)。
- DOI:
- 发表时间:
- 期刊:
- 影响因子:0
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- 通讯作者:
M. Yoshimura, T. An, and K. Ueda: "Observation of Si(110) surfaces by high-temperature scanning tunneling mircoscopy"Jpn. J. Appl. Phys.. 39. 4432-4434 (2000)
M. Yoshimura、T. An 和 K. Ueda:“通过高温扫描隧道显微镜观察 Si(110) 表面”Jpn。
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YOSHIMURA Masamichi其他文献
YOSHIMURA Masamichi的其他文献
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{{ truncateString('YOSHIMURA Masamichi', 18)}}的其他基金
Manipulation of fullerene molecules in graphene films
石墨烯薄膜中富勒烯分子的操控
- 批准号:
24656039 - 财政年份:2012
- 资助金额:
$ 5.38万 - 项目类别:
Grant-in-Aid for Challenging Exploratory Research
Improvement of Sliding Properties of Artificial Hip Joint Metals by Coating of Carbon Nanomaterials
碳纳米材料涂层改善人工髋关节金属滑动性能
- 批准号:
23651098 - 财政年份:2011
- 资助金额:
$ 5.38万 - 项目类别:
Grant-in-Aid for Challenging Exploratory Research
Development of a non-destructive measurement system of nanoscale properties of materials using carbon nanotubes
利用碳纳米管开发材料纳米级特性的无损测量系统
- 批准号:
15310095 - 财政年份:2003
- 资助金额:
$ 5.38万 - 项目类别:
Grant-in-Aid for Scientific Research (B)
Atomic-scale Etching and Deposition using adsorbed Halogen gases on Semiconductor surfaces.
使用半导体表面吸附的卤素气体进行原子级蚀刻和沉积。
- 批准号:
06452121 - 财政年份:1994
- 资助金额:
$ 5.38万 - 项目类别:
Grant-in-Aid for Scientific Research (B)
Phase transition of thin films of organic conductors studied by scanning tunneling spectroscopy
扫描隧道光谱研究有机导体薄膜的相变
- 批准号:
04650007 - 财政年份:1992
- 资助金额:
$ 5.38万 - 项目类别:
Grant-in-Aid for General Scientific Research (C)
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职业:一维纳米化学
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