Development of TEM specimen Holder Enabling Atomic Level Observation under One Atomospheric Pressure
Development of TEM specimen Holder Enabling Atomic Level Observation under One Atomospheric Pressure
批准号:
12555017
负责人:
TAKAI Yoshizo
金额:
$5.12万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2000
资助国家:
日本
项目状态:
已结题
起止时间:
2000 至 2001
中文摘要
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英文摘要
An environmental cell (EC) technique is useful for the study of hydrated and catalytic specimens etc. under various environmental atmosphere by a transmission electron microscope. In the present study, we have developed a film-sealed type EC which enables atomic level observation under one atmospheric pressure. The developed EC has the passages connecting the EC and the outside of the microscope column, therefore, the gas pressure of the specimen environment can be controlled by adjusting the gas flow. In general, the EC must have some windows for electron beam passage and some sealing films covering the windows are necessary to protect the gas leakage into the microscope column. The most important component of the EC is the sealing film. The film must withstand above atmospheric pressure with maintaining properties such as high electron transmittance, amorphousness of the film and so on. In the present study, we succeeded to make a carbon film of 20 nm thick which,withstands the pressure of one atmospheric pressure or more. A buffer layer of triacetylcellulose (TAG) film of about 150 nm in thickness was sandwiched between the carbon film and the metal supporting grid, which works very effectively to realize the resistance to the gas pressure difference. An apparatus to insert the TEM specimen holder with the EC was also developed and TiO2 powder sample was successfully observed at one atmospheric air pressure. By introducing reaction gas to the sample, catalytic behavior of TiO2 might be possible to observe in atomic scale. Precise evaluation on the achieved resolution is now under examining as a function of the atmospheric pressure and the thickness of the sealing film. Plasma induced by high speed electrons incidence sometimes gave damages to the observed sample, which is under investigation based on Monte Cairo computer simulations.
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T.Nagatomi et al.: "Monte Carlo Simulation of X-ray Generation iunder electron Bombardment"3rd International Symposium on Atomic Level Characterizations for New Materials and Devices '01. 1. 37-37 (2001)
T.Nagatomi 等人:“电子轰击下 X 射线生成的蒙特卡罗模拟”第三届新材料和器件原子级表征国际研讨会 01。
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Y.Mizuhara et al.: "Quantitative Measurement of Amount of Charging in Insulator Sample under Electron Beam Irradiation"ECAIA '01. 1. 198-198 (2001)
Y.Mizuhara 等人:“电子束照射下绝缘体样品带电量的定量测量”ECIAA 01。
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T.Kawasaki et al.: "Distorted surface and interface structures of catalytic gold nanoparticles observed by spherical aberration-free phase electron microscopy"J. Appl. Phys.. 79. 3509-3511 (2001)
T.Kawasaki 等人:“通过无球差相位电子显微镜观察催化金纳米粒子的扭曲表面和界面结构”J.
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T.Nagatomi et al.: "Monte Carlo Simulation of X-ray Generation iunder electron Bombardment"3rd International Symposium on Atomic Level Characterizations for New Materials and Devices '01. 1-37 (2001)
T.Nagatomi 等人:“电子轰击下 X 射线生成的蒙特卡罗模拟”第三届新材料和器件原子级表征国际研讨会 01。
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Y. Mizuhara, T. Nagatomi, Y. Kimura, Y. Takai and M. Inoue: "Quantitative Measurement of Amount of Charging in Insulator Sample under Electron Beam Irradiation"9th European Conference on Applications of Surface and Interface Analysis (ECASIA '01)(avignon,
Y. Mizuhara、T. Nagatomi、Y. Kimura、Y. Takai 和 M. Inoue:“电子束辐照下绝缘体样品充电量的定量测量”第九届欧洲表面和界面分析应用会议 (ECASIA 01)
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共 16 条
Simultaneous correction of spherical and chromatic aberrations by dynamic hollow-cone illumination
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批准号:20246015
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$14.06万
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财政年份:2008
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负责人:TAKAI Yoshizo
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依托单位:
Development of bio electron microscopy under ultra low electron dose conditions
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批准号:18206007
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$17.06万
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财政年份:2006
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负责人:TAKAI Yoshizo
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依托单位:
Development of Super Resolution Bio-Phase Transmission Electron Microscopy
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批准号:15360036
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$7.87万
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财政年份:2003
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负责人:TAKAI Yoshizo
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依托单位:
Direct Observation of DNA at a Molecular Scale Level by Three-Dimensional Fourier Filtering Method
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批准号:13450036
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$6.53万
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财政年份:2001
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负责人:TAKAI Yoshizo
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依托单位:
Development of Super Resolution Phase Electron Microscopy
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批准号:10450037
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项目类别:Grant-in-Aid for Scientific Research (B).
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资助金额:$2.94万
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财政年份:1998
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负责人:TAKAI Yoshizo
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依托单位:
海外基金