Development of Hamos-type X-ray micro-analyzer using a cylindrically, bent graphite monochromator

使用圆柱形弯曲石墨单色仪开发Hamos型X射线显微分析仪

• 批准号: 12555170
• 负责人: MATSUBARA Eiichiro
• 金额: $ 7.68万
• 依托单位: Tohoku University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2000
• 资助国家: 日本
• 起止时间: 2000 至 2002
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-12555170/
• 关键词: Bent graphite monochoromator; X-ray micronanalyzer; Mapping of X-ray fluorescence; X-ray diffraction; Maximum entropy method; image data processing; グラファイト集光素子; 蛍光X線; マキシマムエンドロピー法

Fluorescent radiations emitted from a certain point in a sample are focused by diffracting on the inner surface of a cylindrically bent single crystal. Using this fundamental principle, an X-ray microanalyzer has been developed. Three important study results contribute to the present development.(1) First of all, a new fabrication technique of a cylindrical bend graphite single crystal with a large curvature is essential in order to effectively collect fluorescent radiation from a sample. In the present study, the cylindrical graphite with a curvature radius of 2l.07mm was produced by the new fabrication process developed by Matsushita Electric Industrial Co. Ltd.(2) Secondarily, an XMA apparatus consisting of a sealed X-ray tube, sample holder, the bend graphite monochromator and an imaging p]ate as a two dimensional detector was designed so that the best suited performance is expected.(3) Thirdly, a computer program for image data processing based upon the maximum entropy principle was developed to improve a special resolution of the observed image.From the above results, the present XMA apparatus has been developed. In the present circumstances, the best spatial resolution that has been achieved in the present XMA is about 0.1 mm. This is about 10 times larger than the common XMA apparatus using electron convergent beams (EPMA) and about one tenth of the ordinary X-ray fluorescent analyzer. In addition, it takes a quite long time for the image data processing by the present program. We must improve its algorism for better performance. In spite of the worse spatial resolution, the pres t system can be applied to some materials which are not measured by EPMA, such as wet materials, melts, some biomaterials. Consequently, we will develop the present XMA as the complimentary method of EPMA as well as improve it for a better performance.

从样品中的某一点发出的荧光辐射通过在圆柱形弯曲的单晶的内表面上衍射而聚焦。利用这一基本原理，研制了一种X射线微量分析仪。三个重要的研究结果有助于目前的发展。(1)首先，为了有效地收集来自样品的荧光辐射，具有大曲率的圆柱形弯曲石墨单晶的新制造技术是必要的。本研究采用松下电器工业公司开发的新工艺生产了曲率半径为21.07mm的圆柱形石墨。(2)其次，设计了由密封X射线管、样品保持器、弯曲石墨单色器和作为二维探测器的成像板组成的XMA装置，使得预期的最佳性能。(3)第三，为了提高观测图像的空间分辨率，根据最大熵原理编制了图像数据处理的计算机程序，并以此为基础研制了XMA装置。在目前的情况下，在本XMA中已经实现的最佳空间分辨率约为0.1mm。这比使用电子会聚束（EPMA）的普通XMA装置大约10倍，约为普通X射线荧光分析仪的十分之一。另外，用现有程序进行图像数据处理需要相当长的时间。我们必须改进其算法以获得更好的性能。尽管该系统的空间分辨率较低，但它可以应用于一些不能用电子探针测量的材料，如湿材料、熔体、生物材料等。因此，我们将发展现有的XMA作为EPMA的补充方法，并对其进行改进，以获得更好的性能。

项目成果

K.Hayashi, Y.Takahashi, E.Matsubara: "Refinement of X-ray fluorescence holography for determination of local atomic environment"Materials Transactions. 43. 1464-1468 (2002)

K.Hayashi、Y.Takahashi、E.Matsubara：“用于确定局部原子环境的 X 射线荧光全息术的改进”材料交易。

Y.Takahashi, K.Hayashi, E.Matsubara: "Development of laboratory X-ray fluorescence holography equipment"Journal of Materials Research. Vol.18,No.6. (2003)

Y.Takahashi、K.Hayashi、E.Matsubara：“实验室X射线荧光全息设备的开发”材料研究杂志。

K.Hayashi, Y.Takahashi, E.Matsubara: "Refinement of X-ray Fluorescence Holography for Determination of Local Atomic Environment"Materials Transactions. Vol.43,No.7. 1464-1468 (2002)

K.Hayashi、Y.Takahashi、E.Matsubara：“用于确定局部原子环境的 X 射线荧光全息术的改进”材料交易。

松原英一郎: "回折技術とその将来"金属. Vol.71,No.10. 972-975 (2001)

Eiichiro Matsubara：“衍射技术及其未来”金属。第 71 卷，第 972-975 期。

Y. Takahashi, K. Hayashi and E. Matsubara: "Development of laboratory X-ray fluorescence holography equipment"Journal of Materials Research. 18, 6. to be published (2003)

Y. Takahashi、K. Hayashi 和 E. Matsubara：“实验室 X 射线荧光全息设备的开发”材料研究杂志。