200kV Transmission electron microscope

200kV透射电子显微镜

• 批准号: 466823532
• 金额: --
• 依托单位: Technische Universität Chemnitz
• 依托单位国家: 德国
• 项目类别: Major Research Instrumentation
• 财政年份: 2022
• 资助国家: 德国
• 起止时间: 2021-12-31 至 无数据
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/466823532?language=en
• 关键词: 200kV; Transmission; electron; microscope

The proposed transmission electron microscope (TEM) with a powerful electron source allows for different imaging, diffraction and analytical methods for a high-throughput, highly accurate microstructural analysis that will help to address a wide range of research topics in the area of materials science both from engineering and natural science. In particular, it will facilitate imaging bright, dark and high angle annular dark field mode; electron diffraction for structural and phase analysis; measurements of intrinsic magnetic fields (Lorentz microscopy); chemical analysis (by energy dispersive X-ray spectroscopy); tomography and in-situ studies using dedicated in-situ sample holders for investigations at increased temperatures or gas pressures. The instrument configuration is optimized for maximum flexibility for tomography and in-situ measurements that require more space in the pole piece area.

拟议的透射电子显微镜（TEM）具有强大的电子源，允许不同的成像，衍射和分析方法，用于高通量，高精度的微观结构分析，这将有助于解决工程和自然科学领域材料科学的广泛研究课题。特别是，它将有助于成像明亮，黑暗和高角度环形暗场模式;电子衍射结构和相位分析;测量固有磁场（洛伦兹显微镜）;化学分析（通过能量色散X射线光谱法）;断层扫描和原位研究，使用专用的原位样品架在高温或气压下进行研究。仪器配置经过优化，可最大限度地灵活应用于需要更多极片空间的断层扫描和原位测量。