200kV Transmission electron microscope

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The proposed transmission electron microscope (TEM) with a powerful electron source allows for different imaging, diffraction and analytical methods for a high-throughput, highly accurate microstructural analysis that will help to address a wide range of research topics in the area of materials science both from engineering and natural science. In particular, it will facilitate imaging bright, dark and high angle annular dark field mode; electron diffraction for structural and phase analysis; measurements of intrinsic magnetic fields (Lorentz microscopy); chemical analysis (by energy dispersive X-ray spectroscopy); tomography and in-situ studies using dedicated in-situ sample holders for investigations at increased temperatures or gas pressures. The instrument configuration is optimized for maximum flexibility for tomography and in-situ measurements that require more space in the pole piece area.