Quick X-ray diffraction imaging for inhomogeneous polycrystalline materials
Quick X-ray diffraction imaging for inhomogeneous polycrystalline materials
批准号:
17510105
负责人:
SAKURAI Kenji
金额:
$2.37万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2005
资助国家:
日本
项目状态:
已结题
起止时间:
2005 至 2006
中文摘要
除了传统的“平均”衍射模式外,通过提供真实空间成像能力来升级传统的x射线衍射技术具有重要意义。此外,如果成像变得非常快,这项技术将成为一种相当复杂的工具,可以看到正在合成的材料。然后可以说“眼见为实”而不是“眼见为实”。在本研究中,一种由国家材料科学研究所开发的新的x射线成像技术(日本专利,No.3049313, No. 3663439, No. 3834652等)被用于观察样品在冷却、加热和其他一些化学反应过程中的变化。迄今为止,在x射线衍射成像领域,只知道静态成像。由于是第一次尝试拍摄电影,我们需要非常强的x射线。实验在日本筑波KEK光子工厂BL16A1的多极摆动源上进行。我们做了6次实验;2005年11月和12月,2006年2月(两次),4月和5月。在第一年,该仪器已经完成,并且已经可以获得实空间x射线衍射图像,其中像素对应于样品位置。x射线图像像素数为1000 × 1000,空间分辨率为10 × 30微米。捕获图像的间隔根据实验的不同为0.01 - 10秒。还安装了冷却/加热装置。第二年取得了实际的观察结果;溶液结晶、结冰结霜、液态金属凝固等,可在-15 ~ 40℃之间发生。
英文摘要
It is significant to upgrade traditional X-ray diffraction technique by giving real-space imaging capability in addition to conventional 'average' diffraction patterns. Furthermore if the imaging becomes very quick, the technique will be a fairly sophisticated tool to see the materials being synthesized. Then one could say that"Seeing is Creating" rather than "Seeing is Believing". In the present study, a new X-ray imaging technique developed at National Institute for Materials Science (Japanese patent, No.3049313, No. 3663439, No. 3834652 and others) has been employed for looking at changes of samples during cooling, heating and some other chemical reactions. So far, in the field of X-ray diffraction imaging, only static imaging had been known. As trying movie was for the first time, we needed a very strong X-rays.The experiments were carried out with a multi-pole wiggler source at BL16A1, Photon Factory, KEK, Tsukuba, Japan. We did experiments 6 times; November and December in 2005, and February (twice), April and May in 2006. In the first year, the instrument has been completed, and it has become possible to obtain real-space X-ray diffraction images, of which pixels correspond to the sample positions. The pixel numbers of X-ray image is 1000 x 1000,and the spatial resolution is 10 30micron. The interval of capturing image is 0.01 10 secdepending on the experiments. A cooling/heating device has been also installed. In the second year realistic observation has been achieved ; crystallization from solution, icing and frosting, solidification of liquid metals etc., which can take place between-15 and 40℃.
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Efficient Characterization of Combinatorial ZnGa2O4 using Quick X-ray Fluorescence Imaging
使用快速 X 射线荧光成像有效表征组合 ZnGa2O4
DOI:
--
发表时间:
2007
期刊:
Adv. X-Ray Chem Anal. Jpn, 38
影响因子:
--
作者:
[H.Eba, K.Sakurai]
通讯作者:
K.Sakurai
2D diffraction imaging of monoclinic and cubic ZrO2
单斜晶系和立方晶系 ZrO2 的二维衍射成像
DOI:
--
发表时间:
2005
期刊:
Photon Factory Activity Report 2004 #22
影响因子:
--
作者:
[M.Mizusawa, K.Sakurai]
通讯作者:
K.Sakurai
Combinatorial Screening of Photocatalytic ZnGa2O4 by X-Ray Absorption Fine Structure Imaging
X射线吸收精细结构成像光催化ZnGa2O4的组合筛选
DOI:
--
发表时间:
2006
期刊:
Proceedings of the 16th International Microscopy Congress
影响因子:
--
作者:
[H.Eba, K.Sakurai]
通讯作者:
K.Sakurai
Combinatorial Screening of Photo catalytic ZnGa2O4 by X-Ray Absorption Fine Structure Imaging
X射线吸收精细结构成像光催化ZnGa2O4的组合筛选
DOI:
--
发表时间:
2006
期刊:
Proceedings of the 16th International Microscopy Congress
影响因子:
--
作者:
[H.Eba, K.Sakurai]
通讯作者:
K.Sakurai
高速蛍光X線イメージング法によるZnGa204コンビナトリアル試料の迅速評価
利用高速荧光X射线成像方法快速评估ZnGa2O4组合样品
DOI:
--
发表时间:
2007
期刊:
X線分析の進歩 38
影响因子:
--
作者:
[江場宏美, 桜井健次]
通讯作者:
桜井健次
共 12 条
Novel X-ray structure imaging based on the combination of X-ray diffraction and X-ray absorption fine structure
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批准号:20350041
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$12.31万
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财政年份:2008
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负责人:SAKURAI Kenji
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依托单位:
Preclinical Study of Radioimmunoguided Surgery Using Metastases Model of Human Colon Cancer in Congenitally Athymic mice.
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批准号:01480334
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项目类别:Grant-in-Aid for General Scientific Research (B)
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资助金额:$1.86万
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财政年份:1989
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负责人:SAKURAI Kenji
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依托单位:
Simulation and Clinical Implication of Peripheral Circulation
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批准号:61480273
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项目类别:Grant-in-Aid for General Scientific Research (B)
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资助金额:$2.18万
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财政年份:1986
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负责人:SAKURAI Kenji
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依托单位: