Dvelopment of Sn-Bi Based Low Temperature Solders which Enables Step Soldering
Dvelopment of Sn-Bi Based Low Temperature Solders which Enables Step Soldering
批准号:
17560633
负责人:
UENISHI Keisuke
金额:
$2.3万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2005
资助国家:
日本
项目状态:
已结题
起止时间:
2005 至 2006
中文摘要
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英文摘要
Effect of Ag Addition to Sn-Bi Eutectic Solders on the Microstructure and Properties of Joints with Cu. About 0.5mass% of Ag addition to the Sn-Bi changes the eutectic microstructure fine through Sn-Bi-Ag3Sn ternary eutectic solidification. With decreasing the eutectic microstructure, the ductility increased more than that of Sn-Pb solders especially at the rapid stress speed. Addition of Ag more than 1 mass%, however, formed coarse and uniaxial Ag3Sn which decreased the ductility of solders. rand improved its ductility.By using Sn-Ag-Bi solders with low melting temperature about 410K, low temperature reflow soldering with Cu pad can be achieved at 433K. Microjoint with Cu using Sn-Bi-Ag solder exhibited the comparable tensile strength and thermal cycle fatigue property with that of Sn-Ag-Cu solders. Be the advantages of the low temperature soldering at 433K, residual stress caused by reflow soldering became smaller and fracture between Cu pad and substrate was drastically supressed. For the joints using Sn-Bi-Ag, fracture by tensile test occurs at the interface between Cu6Sn5 reaction layer and solder. The degradation of joint strength during the aging was caused by the growth of reaction layer. The growth behavior of reaction layer, however, was eastimated to be almost same as that for the joints using Sn-Ag-Cu solders by the kinetic analysis.
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Sn-Bi系はんだを用いた低温実装による基板への熱負荷低減効果
使用 Sn-Bi 焊料进行低温安装,减少电路板热负荷的效果
DOI:
--
发表时间:
2007
期刊:
Proc. 13th Sympo. on Micro joining and Assembly Technologies for Electronics Vol.13
影响因子:
--
作者:
[縄舟 秀美, 他50名(分担), 上西啓介]
通讯作者:
上西啓介
Effect of Low Temperature Soldering using Sn-Bi Based Solders on Depression of Thermal Stress in Substrates
使用 Sn-Bi 基焊料的低温焊接对降低基板热应力的影响
DOI:
--
发表时间:
2007
期刊:
Proc.13th Sympo.on Microjoining and Assembly Technologies in Electronics Vol.13
影响因子:
--
作者:
[縄舟 秀美, 他50名(分担), 上西啓介, Keisuke UENISHI]
通讯作者:
Keisuke UENISHI
Joint property of packages prepared by low temperature soldering using Ag added Sn-Bi solders
添加Ag的Sn-Bi焊料低温焊接制备的封装的接合性能
DOI:
--
发表时间:
2006
期刊:
Proceedings of 16th Symposium on Micro Electronics (MES2006) Vol.16
影响因子:
--
作者:
[縄舟 秀美, 他50名(分担), 上西啓介, Keisuke UENISHI, 上西啓介, 鳥居久範, 小山晃弘, 中嶋清吾, 赤松俊也, Hisanori TORII]
通讯作者:
Hisanori TORII
各種バリア金属材料とSn-Ag系はんだとの接合界面組織
各种阻挡金属材料与Sn-Ag焊料之间的键合界面结构
DOI:
--
发表时间:
2006
期刊:
Proc. 12th Sympo. on Microjoining and Assembly Technologies for Electronics Vol.12
影响因子:
--
作者:
[縄舟 秀美, 他50名(分担), 上西啓介, Keisuke UENISHI, 上西啓介, 鳥居久範, 小山晃弘, 中嶋清吾, 赤松俊也, Hisanori TORII, Akihiro OYAMA, Seigo NAKAJIMA, Toshiya AKAMATSU, 鳥居久範, 小山晃弘, 田中里英子]
通讯作者:
田中里英子
Interfacial Reaction between Sn-Ag Based Solders and Au/Ni Alloy Platings
Sn-Ag 基焊料与 Au/Ni 合金镀层之间的界面反应
DOI:
--
发表时间:
2005
期刊:
Materials Science Forum Vol.502
影响因子:
--
作者:
[縄舟 秀美, 他50名(分担), 上西啓介, Keisuke UENISHI, 上西啓介, 鳥居久範, 小山晃弘, 中嶋清吾, 赤松俊也, Hisanori TORII, Akihiro OYAMA, Seigo NAKAJIMA, Toshiya AKAMATSU, 鳥居久範, 小山晃弘, 田中里英子, Keisuke Uenishi]
通讯作者:
Keisuke Uenishi
共 13 条
Investugation of Electro-migration Behavior in Solder Joints
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批准号:22560722
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$2.5万
-
财政年份:2010
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负责人:UENISHI Keisuke
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依托单位:
Effect of Third Element Addition on Eutectic Microstructure of Lead Free Low Temperature Sn-Bi Based Solders
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批准号:19560728
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$3.0万
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财政年份:2007
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负责人:UENISHI Keisuke
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依托单位:
Control of Interfacial Reaction in the Dissimilar Joints Using Shape Memory Alloy Thin Wires for the Fabrication of Medical Devices Inserted in Blood Vessel
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批准号:14550703
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$2.3万
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财政年份:2002
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负责人:UENISHI Keisuke
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依托单位: